Atom Probe Field Ion Microscopy

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Atom Probe Field Ion Microscopy by Miller, M. K.; Cerezo, A.; Hetherington, M. G.; Smith, G. D. W., 9780198513872
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  • ISBN: 9780198513872 | 0198513879
  • Cover: Hardcover
  • Copyright: 11/28/1996

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This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely dueto the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-theart account of this important field, and is intended for a graduate-level readership.
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