Handbook of Charged Particle Optics, Second

Balancing its coverage of theory with a wide range of application areas, Handbook of Charged Particle Optics provides a complete guide to understanding, designing, and using high resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources. Including additional references to past and present work in the field, this comprehensive text also presents up-to-date information of Schottky electron as well as liquid metal ion sources.

Preface to the Second Edition	p. vii
Editor	p. ix
Contributors	p. xi
Review of ZrO/W Schottky Cathode	p. 1
Liquid Metal Ion Sources	p. 29
Gas Field Ionization Sources	p. 87
Magnetic Lenses for Electron Microscopy	p. 129
Electrostatic Lenses	p. 161
Aberrations	p. 209
Space Charge and Statistical Coulomb Effects	p. 341
Resolution	p. 391
The Scanning Electron Microscope	p. 437
The Scanning Transmission Electron Microscope	p. 497
Focused Ion Beams	p. 523
Aberration Correction in Electron Microscopy	p. 601
Computational Resources for Electron Microscopy	p. 641
Index	p. 645
Table of Contents provided by Ingram. All Rights Reserved.

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Handbook of Charged Particle Optics, Second Edition

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Table of Contents

Supplemental Materials