Improved Analysis of DNA Short Tandem Repeats With Time-of-flight Mass Spectrometry

, by ; ; ; ;
Improved Analysis of DNA Short Tandem Repeats With Time-of-flight Mass Spectrometry by Butler, John M.; Becker, Christopher H.; U. S. Department of Justice; Office of Justice Programs; National Institute of Justice, 9781478268017
Write a Review
Note: Supplemental materials are not guaranteed with Rental or Used book purchases.
  • ISBN: 9781478268017 | 1478268018
  • Cover: Paperback
  • Copyright: 7/18/2012

  • Rent

    (Recommended)

    $8.93
     
    Term
    Due
    Price
    *This item is part of an exclusive publisher rental program and requires an additional convenience fee. This fee will be reflected in the shopping cart.

  • Buy New

    Usually Ships in 3-5 Business Days

    $13.54

Loading Icon

Please wait while the item is added to your bag...
Continue Shopping Button
Checkout Button
Loading Icon
Continue Shopping Button