Introduction to Conventional Transmission Electron Microscopy

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ISBN: 9780521620062 | 0521620066
Cover: Hardcover
Copyright: 4/21/2003

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This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. In addition to including a large selection of worked examples and homework problems, the volume is accompanied by a supplementary website (http://ctem.web.cmu.edu/) containing interactive modules and over 30,000 lines of free Fortran 90 source code. The work is based on a lecture course given by Marc De Graef in the Department of Materials Science and Engineering at Carnegie Mellon University.

Preface

xiv

Acknowledgements

xix

Figure reproductions

xxi

Basic crystallography

(78)

Introduction

(1)

Direct space and lattice geometry

(7)

Basis vectors and unit cells

(3)

The dot product and the direct metric tensor

(4)

Definition of reciprocal space

(14)

Planes and Miller indices

(1)

The reciprocal basis vectors

(4)

Lattice geometry in reciprocal space

(2)

Relations between direct space and reciprocal space

(2)

The non-Cartesian vector cross product

(5)

The hexagonal system

(6)

Directions in the hexagonal system

(2)

The reciprocal hexagonal lattice

(3)

The stereographic projection

(5)

Drawing a point

(1)

Constructing a great circle through two poles

(1)

Constructing a small circle around a pole

(1)

Finding the pole of a great circle

(1)

Measuring the angle between two poles

(1)

Measuring the angle between two great circles

(1)

Crystal symmetry

(13)

Symmetry operators

(4)

Mathematical representation of symmetry operators

(3)

Point groups

(2)

Families of planes and directions

(2)

Space groups

(1)

Coordinate transformations

(8)

Transformation rules

(2)

Examples of coordinate transformations

(3)

Rhombohedral and hexagonal settings of the trigonal system

(2)

Converting vector components into Cartesian coordinates

(4)

Crystallographic calculations on the computer

(18)

Preliminary remarks

(3)

Implementing the metric tensor formalism

(2)

Using space groups on the computer

(4)

Graphical representation of direct and reciprocal space

(2)

Stereographic projections on the computer

(7)

Recommended reading

458

(2)

Exercises

458

(2)

Defects in crystals

460

(58)

Introduction

460

(1)

Crystal defects and displacement fields

460

(5)

Numerical simulation of defect contrast images

465

(13)

Geometry of a thin foil containing a defect

466

(4)

Example of the use of the various reference frames

470

(4)

Dynamical multi-beam computations for a column containing a displacement field

474

(4)

Image contrast for selected defects

478

(37)

Coherent precipitates and voids

479

(2)

Line defects

481

(11)

Planar defects

492

(19)

Planar defects and the systematic row

511

(3)

Other displacement fields

514

(1)

Concluding remarks and recommended reading

515

(3)

Exercises

516

(2)

Electron diffraction patterns

518

(67)

Introduction

518

(1)

Spot patterns

518

(17)

Indexing of simple spot patterns

518

(5)

Zone axis patterns and orientation relations

523

(2)

Double diffraction

525

(5)

Overlapping crystals and Moire patterns

530

(5)

Ring patterns

535

(2)

Linear features in electron diffraction patterns

537

(13)

Streaks

537

(3)

HOLZ lines

540

(4)

Kikuchi lines

544

(6)

Convergent beam electron diffraction

550

(6)

Point group determination

551

(3)

Space group determination

554

(2)

Diffraction effects in modulated crystals

556

(15)

Modulation types

556

(2)

Commensurate modulations

558

(11)

Incommensurate modulations and quasicrystals

569

(2)

Diffuse intensity due to short range ordering

571

(4)

Diffraction effects from polyhedral particles

575

(10)

Exercises

584

(1)

Phase contrast microscopy

585

(76)

Introduction

585

(2)

A simple experimental example

586

(1)

The microscope as an information channel

587

(51)

The microscope point spread and transfer functions

589

(17)

The influence of beam coherence

606

(15)

Plug in the numbers

621

(5)

Image formation for an amorphous thin foil

626

(3)

Alignment and measurement of various imaging parameters

629

(9)

High-resolution image simulations

638

(3)

Lorentz image simulations

641

(8)

Example Lorentz image simulations for periodic magnetization patterns

642

(6)

Fresnel fringes for non-magnetic objects

648

(1)

Exit wave reconstruction

649

(10)

What are we looking for?

649

(3)

Exit wave reconstruction for Lorentz microscopy

652

(6)

Exercises

658

(1)

Final remarks

659

(2)

Appendix A1 Explicit crystallographic equations

661

(4)

Appendix A2 Physical constants

665

(1)

Appendix A3 Space group encoding and other software

666

(1)

Appendix A4 Point groups and space groups

667

(10)

List of symbols

677

(8)

Bibliography

685

(20)

Index

705

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Introduction to Conventional Transmission Electron Microscopy

Summary

Table of Contents

Supplemental Materials