- ISBN: 9780306444333 | 030644433X
- Cover: Hardcover
- Copyright: 2/1/1994
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This book systematically describes the most widely used techniques for the microanalysis of the physical, structural, and compositional properties of solids. Covering electron beams, ion beams, photon beams, and acoustic waves, it will provide physicists, materials scientists, electrical engineers, chemists, and their students with a comprehensive reference source.