Note: Supplemental materials are not guaranteed with Rental or Used book purchases.
- ISBN: 9780824795542 | 0824795547
- Cover: Hardcover
- Copyright: 4/26/1995
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
Preface to the Second Edition | iii | ||||
Preface to the First Edition | v | ||||
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Appendix 1 Nomenclature | 461 | (2) | |||
Appendix 2 Mass Absorption Coefficients | 463 | (4) | |||
Appendix 3 Conversions and Physical Constants | 467 | (2) | |||
Appendix 4 Atomic Weights and Densities | 469 | (2) | |||
Appendix 5 Atomic Wavelengths and Energies | 471 | (2) | |||
Appendix 6 Wavelength Tables for K, L, and M Series | 473 | (6) | |||
Index | 479 |
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