Surface Analysis The Principal Techniques

This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis.Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.

John C. Vickerman BSc in Chemistry (Edinburgh), Ph.D. in Surface Chemistry (Bristol), DSc (Bristol). Predoctoral fellowships at the Universities of Perugia and Rome, postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. Sabbatical study periods at the University of Munich, the Free University of Berlin and Pennsylvania State University.

Dr Ian Gilmore, Surface and Nano-Analysis, National Physical Laboratory, Teddington, UK
Ian is a Principal Research Scientist in the Surface and Nano-Analysis Research team and joined NPL in 1991. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static static SIMS called gentle-SIMS or G-SIMS,
He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. Ian is a Fellow of the Institute of Physics a member of the EPSRC College and a member of the American Vacuum Society.

List of Contributors
Preface
Introduction
How do we Define the Surface?
How Many Atoms in a Surface?
Information Required
Surface Sensitivity
Radiation Effects Surface Damage
Complexity of the Data
Auger Electron Spectroscopy
Introduction
Principle of the Auger Process
Instrumentation
Quantitative Analysis
Depth Profile Analysis
Summary
References
Problems
Electron Spectroscopy for Chemical Analysis
Overview
X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids
Binding Energy and the Chemical Shift
Inelastic Mean Free Path and Sampling Depth
Quantification
Spectral Features
Instrumentation
Spectral Quality
Depth Profiling
XY Mapping and Imaging
Chemical Derivatization
Valence Band
Perspectives
Conclusions
Acknowledgements
References
Problems
Molecular Surface Mass Spectrometry by SIMS
Introduction
Basic Concepts
Experimental Requirements
Secondary Ion Formation
Modes of Analysis
Ionization of the Sputtered Neutrals
Ambient Methods of Desorption Mass Spectrometry
References
Problems
Dynamic SIMS
Fundamentals and Attributes
Areas and Methods of Application
Quantification of Data
Novel Approaches
Instrumentation
Conclusions
References
Problems
Low-Energy Ion Scattering and Rutherford Backscattering
Introduction
Physical Basis
Rutherford Backscattering
Low-Energy Ion Scattering
Acknowledgement
References
Problems
Key Facts
Vibrational Spectroscopy from Surfaces
Introduction
Infrared Spectroscopy from Surfaces
Electron Energy Loss Spectroscopy (EELS)
The Group Theory of Surface Vibrations
Laser Raman Spectroscopy from Surfaces
Inelastic Neutron Scattering (INS)
Sum-Frequency Generation Methods
References
Problems
Surface Structure Determination by Interference Techniques
Introduction
Electron Diffraction Techniques
X-ray Techniques
Photoelectron Diffraction
References
Scanning Probe Microscopy
Introduction
Scanning Tunnelling Microscopy
Atomic Force Microscopy
Scanning Near-Field Optical Microscopy
Other Scanning Probe Microscopy Techniques
Lithography Using Probe Microscopy Methods
Conclusions
References
Problems
The Application of Multivariate Data Analysis Techniques in Surface Analysis
Introduction
Basic Concepts
Factor Analysis for Identification
Regression Methods for Quantification
Methods for Classification
Summary and Conclusion
Acknowledgements
References
Problems
Vacuum Technology for Applied Surface Science
Introduction: Gases and Vapours
The Pressure Regions of Vacuum Technology and their Characteristics
Production of a Vacuum
Measurement of Low Pressures
Acknowledgement
References
Units, Fundamental Physical Constants and Conversions
Base Units of the SI
Fundamental Physical Constants
Other Units and Conversions to SI
References
Index
Table of Contents provided by Publisher. All Rights Reserved.

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Surface Analysis The Principal Techniques

Summary

Author Biography

Table of Contents

Supplemental Materials