Design and Analysis of Accelerated Tests for Mission Critical Reliability
, by LuValle, Michael J.; Lefevre, Bruce G.; Kannan, Sriraman- ISBN: 9780203492031 | 020349203X
- Cover:
- Copyright: 4/27/2004
This book presents innovative theory and methods for recognizing and handling the more complicated cases often encountered in practice. It integrates a physical understanding of underlying phenomena and the statistical modeling of observation "noise" to provide a single theoretical framework for accelerated testing. The treatment includes general approaches that can be used with various computational software packages and an explicit computing environment in S-PLUS, numerous worked examples, end-of-chapter exercises, and chapter appendices containing technical and theoretical details. Source code written by the authors is included and available for download from the CRC Web site.



