Characterization and Control of Interfaces for High Quality Advanced Materials

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Characterization and Control of Interfaces for High Quality Advanced Materials by Ewsuk, Kevin; Nogi, Kiyoshi; Reiterer, Markus; Tomsia, Antoni; Glass, S. Jill; Waesche, Rolf; Uematsu, Keizo; Naito, Makio, 9781574981704
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  • ISBN: 9781574981704 | 1574981706
  • Cover: Paperback
  • Copyright: 4/28/2003

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    $151.24

Interface characterization and control are critical in the design and manufacture of high quality advanced materials, particularly, for nanomaterials. This proceedings features papers on interface science and technology that provide a unique and state-of-the art perspective on interface characterization and control. Articles from scientists and engineers from 11 different countries address interface control, high temperature interfaces, nanoparticle design, nanotechnology, suspension control, novel processing, particulate materials, microstructure, and hot gas cleaning. This unique volume will serve as a valuable reference for scientists and engineers interested in interfaces, particulate materials, and nanotechnology.
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