22nd IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft 2007)

DFT 2007 covers the traditional DFT topics including defect tolerance, error correction, reliability evaluation and analysis, fault tolerant designs, and test and diagnosis. In addition, relatively new topics are covered as well, including approaches for defect and fault tolerance in network-on-chips, nanotechnology, DNA self-assembled networks, and soft errors.Contents:Reliable NoCs and SoCs, Single Event Effects, Defect and Fault Tolerance, Fault Injection and Reliability Analysis, Testing and Design for Testability, Soft Errors, Dependable Solutions for Memories and Storage, Reliable Design Techniques, Emerging Technologies, Reliable Applications