- ISBN: 9780470192351 | 0470192356
- Cover: Hardcover
- Copyright: 3/16/2009
Signal integrity has become the key issue in most high-performance digital designs. Now, from the foremost experts in the field, this book leverages theory and techniques from non-related fields such as applied physics, communications, and microwave engineering and applies them to the field of high-speed digital design. This approach creates an optimal combination of theory and practice that is meaningful to practicing engineers and graduate students alike.
STEPHEN H. HALL is a Senior Staff Engineer at Intel Corporation, where he leads a team focused on the research of new modeling and measurement solutions for channel speeds as high as 30Gb/sec. Previously at Intel, he was the lead designer for desktop and server buses on Pentium® II, III, and IV based systems, coordinated research in the area of high-speed signaling with multiple universities, led research and development teams in the area of high-speed modeling, and taught signal integrity courses to engineers in two countries. He is also the author of High-Speed Digital System Design (Wiley).
HOWARD L. HECK is a Principal Engineer at Intel Corporation, where he leads development of the signaling specifications and solutions for USB 3.0. He also teaches high-speed digital interconnect design at the Oregon Graduate Institute, is a Senior Member of the IEEE, and holds five patents in the area of high-performance packaging and interconnects, with five more pending.
| Preface | p. xv |
| Introduction: The Importance of Signal Integrity | p. 1 |
| Computing Power: Past and Future | p. 1 |
| The Problem | p. 4 |
| The Basics | p. 5 |
| A New Realm of Bus Design | p. 7 |
| Scope of the Book | p. 7 |
| Summary | p. 8 |
| References | p. 8 |
| Electromagnetic Fundamentals for Signal Integrity | p. 9 |
| Maxwell's Equations | p. 10 |
| Common Vector Operators | p. 13 |
| Vector | p. 13 |
| Dot Product | p. 13 |
| Cross Product | p. 14 |
| Vector and Scalar Fields | p. 15 |
| Flux | p. 15 |
| Gradient | p. 18 |
| Divergence | p. 18 |
| Curl | p. 20 |
| Wave Propagation | p. 23 |
| Wave Equation | p. 23 |
| Relation Between E and H and the Transverse Electromagnetic Mode | p. 25 |
| Time-Harmonic Fields | p. 27 |
| Propagation of Time-Harmonic Plane Waves | p. 28 |
| Electrostatics | p. 32 |
| Electrostatic Scalar Potential in Terms of an Electric Field | p. 36 |
| Energy in an Electric Field | p. 37 |
| Capacitance | p. 40 |
| Energy Stored in a Capacitor | p. 41 |
| Magnetostatics | p. 42 |
| Magnetic Vector Potential | p. 46 |
| Inductance | p. 48 |
| Energy in a Magnetic Field | p. 51 |
| Power Flow and the Poynting Vector | p. 53 |
| Time-Averaged Values | p. 56 |
| Reflections of Electromagnetic Waves | p. 57 |
| Plane Wave Incident on a Perfect Conductor | p. 57 |
| Plane Wave Incident on a Lossless Dielectric | p. 60 |
| References | p. 62 |
| Problems | p. 62 |
| Ideal Transmission-Line Fundamentals | p. 65 |
| Transmission-Line Structures | p. 66 |
| Wave Propagation on Loss-Free Transmission Lines | p. 67 |
| Electric and Magnetic Fields on a Transmission Line | p. 68 |
| Telegrapher's Equations | p. 73 |
| Equivalent Circuit for the Loss-Free Case | p. 76 |
| Wave Equation in Terms of LC | p. 80 |
| Transmission-Line Properties | p. 82 |
| Transmission-Line Phase Velocity | p. 82 |
| Transmission-Line Characteristic Impedance | p. 82 |
| Effective Dielectric Permittivity | p. 83 |
| Simple Formulas for Calculating the Characteristic Impedance | p. 85 |
| Validity of the TEM Approximation | p. 86 |
| Transmission-Line Parameters for the Loss-Free Case | p. 90 |
| Laplace and Poisson Equations | p. 91 |
| Transmission-Line Parameters for a Coaxial Line | p. 91 |
| Transmission-Line Parameters for a Microstrip | p. 94 |
| Charge Distribution Near a Conductor Edge | p. 100 |
| Charge Distribution and Transmission-Line Parameters | p. 104 |
| Field Mapping | p. 107 |
| Transmission-Line Reflections | p. 113 |
| Transmission-Line Reflection and Transmission Coefficient | p. 113 |
| Launching an Initial Wave | p. 116 |
| Multiple Reflections | p. 116 |
| Lattice Diagrams and Over- or Underdriven Transmission Lines | p. 118 |
| Lattice Diagrams for Nonideal Topologies | p. 121 |
| Effect of Rise and Fall Times on Reflections | p. 129 |
| Reflections from Reactive Loads | p. 129 |
| Time-Domain Reflectometry | p. 134 |
| Measuring the Characteristic Impedance and Delay of a Transmission Line | p. 134 |
| Measuring Inductance and Capacitance of Reactive Structures | p. 137 |
| Understanding the TDR Profile | p. 140 |
| References | p. 140 |
| Problems | p. 141 |
| Crosstalk | p. 145 |
| Mutual Inductance and Capacitance | p. 146 |
| Mutual Inductance | p. 147 |
| Mutual Capacitance | p. 149 |
| Field Solvers | p. 152 |
| Coupled Wave Equations | p. 153 |
| Wave Equation Revisited | p. 153 |
| Coupled Wave Equations | p. 155 |
| Coupled Line Analysis | p. 157 |
| Impedance and Velocity | p. 157 |
| Coupled Noise | p. 165 |
| Modal Analysis | p. 177 |
| Modal Decomposition | p. 178 |
| Modal Impedance and Velocity | p. 180 |
| Reconstructing the Signal | p. 180 |
| Modal Analysis | p. 181 |
| Modal Analysis of Lossy Lines | p. 192 |
| Crosstalk Minimization | p. 193 |
| Summary | p. 194 |
| References | p. 195 |
| Problems | p. 195 |
| Nonideal Conductor Models | p. 201 |
| Signals Propagating in Unbounded Conductive Media | p. 202 |
| Propagation Constant for Conductive Media | p. 202 |
| Skin Depth | p. 204 |
| Classic Conductor Model for Transmission Lines | p. 205 |
| Dc Losses in Conductors | p. 206 |
| Frequency-Dependent Resistance in Conductors | p. 207 |
| Frequency-Dependent Inductance | p. 213 |
| Power Loss in a Smooth Conductor | p. 218 |
| Surface Roughness | p. 222 |
| Hammerstad Model | p. 223 |
| Hemispherical Model | p. 228 |
| Huray Model | p. 237 |
| Conclusions | p. 243 |
| Transmission-Line Parameters for Nonideal Conductors | p. 244 |
| Equivalent Circuit, Impedance, and Propagation Constant | p. 244 |
| Telegrapher's Equations for a Real Conductor and a Perfect Dielectric | p. 246 |
| References | p. 247 |
| Problems | p. 247 |
| Electrical Properties of Dielectrics | p. 249 |
| Polarization of Dielectrics | p. 250 |
| Electronic Polarization | p. 250 |
| Orientational (Dipole) Polarization | p. 253 |
| Ionic (Molecular) Polarization | p. 253 |
| Relative Permittivity | p. 254 |
| Classification of Dielectric Materials | p. 256 |
| Frequency-Dependent Dielectric Behavior | p. 256 |
| Dc Dielectric Losses | p. 257 |
| Frequency-Dependent Dielectric Model: Single Pole | p. 257 |
| Anomalous Dispersion | p. 261 |
| Frequency-Dependent Dielectric Model: Multipole | p. 262 |
| Infinite-Pole Model | p. 266 |
| Properties of a Physical Dielectric Model | p. 269 |
| Relationship Between e' and e" | p. 269 |
| Mathematical Limits | p. 271 |
| Fiber-Weave Effect | p. 274 |
| Physical Structure of an FR4 Dielectric and Dielectric Constant Variation | p. 275 |
| Mitigation | p. 276 |
| Modeling the Fiber-Weave Effect | p. 277 |
| Environmental Variation in Dielectric Behavior | p. 279 |
| Environmental Effects on Transmission-Line Performance | p. 281 |
| Mitigation | p. 283 |
| Modeling the Effect of Relative Humidity on an FR4 Dielectric | p. 284 |
| Transmission-Line Parameters for Lossy Dielectrics and Realistic Conductors | p. 285 |
| Equivalent Circuit, Impedance, and Propagation Constant | p. 285 |
| Telegrapher's Equations for Realistic Conductors and Lossy Dielectrics | p. 291 |
| References | p. 292 |
| Problems | p. 292 |
| Differential Signaling | p. 297 |
| Removal of Common-Mode Noise | p. 299 |
| Differential Crosstalk | p. 300 |
| Virtual Reference Plane | p. 302 |
| Propagation of Modal Voltages | p. 303 |
| Common Terminology | p. 304 |
| Drawbacks of Differential Signaling | p. 305 |
| Mode Conversion | p. 305 |
| Fiber-Weave Effect | p. 310 |
| Reference | p. 313 |
| Problems | p. 313 |
| Mathematical Requirements for Physical Channels | p. 315 |
| Frequency-Domain Effects in Time-Domain Simulations | p. 316 |
| Linear and Time Invariance | p. 316 |
| Time- and Frequency-Domain Equivalencies | p. 317 |
| Frequency Spectrum of a Digital Pulse | p. 321 |
| System Response | p. 324 |
| Single-Bit (Pulse) Response | p. 327 |
| Requirements for a Physical Channel | p. 331 |
| Causality | p. 331 |
| Passivity | p. 340 |
| Stability | p. 343 |
| References | p. 345 |
| Problems | p. 345 |
| Network Analysis for Digital Engineers | p. 347 |
| High-Frequency Voltage and Current Waves | p. 349 |
| Input Reflection into a Terminated Network | p. 349 |
| Input Impedance | p. 353 |
| Network Theory | p. 354 |
| Impedance Matrix | p. 355 |
| Scattering Matrix | p. 358 |
| ABCD Parameters | p. 382 |
| Cascading S-Parameters | p. 390 |
| Calibration and Deembedding | p. 395 |
| Changing the Reference Impedance | p. 399 |
| Multimode S-Parameters | p. 400 |
| Properties of Physical S-Parameters | p. 406 |
| Passivity | p. 406 |
| Reality | p. 408 |
| Causality | p. 408 |
| Subjective Examination of S-Parameters | p. 410 |
| References | p. 413 |
| Problems | p. 413 |
| Topics in High-Speed Channel Modeling | p. 417 |
| Creating a Physical Transmission-Line Model | p. 418 |
| Tabular Approach | p. 418 |
| Generating a Tabular Dielectric Model | p. 419 |
| Generating a Tabular Conductor Model | p. 420 |
| NonIdeal Return Paths | p. 422 |
| Path of Least Impedance | p. 422 |
| Transmission Line Routed Over a Gap in the Reference Plane | p. 423 |
| Summary | p. 434 |
| Vias | p. 434 |
| Via Resonance | p. 434 |
| Plane Radiation Losses | p. 437 |
| Parallel-Plate Waveguide | p. 439 |
| References | p. 441 |
| Problems | p. 442 |
| I/O Circuits and Models | p. 443 |
| I/O Design Considerations | p. 444 |
| Push-Pull Transmitters | p. 446 |
| Operation | p. 446 |
| Linear Models | p. 448 |
| Nonlinear Models | p. 453 |
| Advanced Design Considerations | p. 455 |
| CMOS receivers | p. 459 |
| Operation | p. 459 |
| Modeling | p. 460 |
| Advanced Design Considerations | p. 460 |
| ESD Protection Circuits | p. 460 |
| Operation | p. 461 |
| Modeling | p. 461 |
| Advanced Design Considerations | p. 463 |
| On-Chip Termination | p. 463 |
| Operation | p. 463 |
| Modeling | p. 463 |
| Advanced Design Considerations | p. 464 |
| Bergeron Diagrams | p. 465 |
| Theory and Method | p. 470 |
| Limitations | p. 474 |
| Open-Drain Transmitters | p. 474 |
| Operation | p. 474 |
| Modeling | p. 476 |
| Advanced Design Considerations | p. 476 |
| Differential Current-Mode Transmitters | p. 479 |
| Operation | p. 479 |
| Modeling | p. 480 |
| Advanced Design Considerations | p. 480 |
| Low-Swing and Differential Receivers | p. 481 |
| Operation | p. 481 |
| Modeling | p. 482 |
| Advanced Design Considerations | p. 483 |
| IBIS Models | p. 483 |
| Model Structure and Development Process | p. 483 |
| Generating Model Data | p. 485 |
| Differential I/O Models | p. 488 |
| Example of an IBIS File | p. 490 |
| Summary | p. 492 |
| References | p. 492 |
| Problems | p. 494 |
| Equalization | p. 499 |
| Analysis and Design Background | p. 500 |
| Maximum Data Transfer Capacity | p. 500 |
| Linear Time-Invariant Systems | p. 502 |
| Ideal Versus Practical Interconnects | p. 506 |
| Equalization Overview | p. 511 |
| Continuous-Time Linear Equalizers | p. 513 |
| Passive CTLEs | p. 514 |
| Active CTLEs | p. 521 |
| Discrete Linear Equalizers | p. 522 |
| Transmitter Equalization | p. 525 |
| Coefficient Selection | p. 530 |
| Receiver Equalization | p. 535 |
| Nonidealities in DLEs | p. 536 |
| Adaptive Equalization | p. 536 |
| Decision Feedback Equalization | p. 540 |
| Summary | p. 542 |
| References | p. 545 |
| Problems | p. 546 |
| Modeling and Budgeting of Timing Jitter and Noise | p. 549 |
| Eye Diagram | p. 550 |
| Bit Error Rate | p. 552 |
| Worst-Case Analysis | p. 552 |
| Bit Error Rate Analysis | p. 555 |
| Jitter Sources and Budgets | p. 560 |
| Jitter Types and Sources | p. 561 |
| System Jitter Budgets | p. 568 |
| Noise Sources and Budgets | p. 572 |
| Noise Sources | p. 572 |
| Noise Budgets | p. 579 |
| Peak Distortion Analysis Methods | p. 583 |
| Superposition and the Pulse Response | p. 583 |
| Worst-Case Bit Patterns and Data Eyes | p. 585 |
| Peak Distortion Analysis Including Crosstalk | p. 594 |
| Limitations | p. 598 |
| Summary | p. 599 |
| References | p. 599 |
| Problems | p. 600 |
| System Analysis Using Response Surface Modeling | p. 605 |
| Model Design Considerations | p. 606 |
| Case Study: 10-Gb/s Differential PCB Interface | p. 607 |
| RSM Construction by Least Squares Fitting | p. 607 |
| Measures of Fit | p. 615 |
| Residuals | p. 615 |
| Fit Coefficients | p. 616 |
| Significance Testing | p. 618 |
| Model Significance: The F-Test | p. 618 |
| Parameter Significance: Individual t-Tests | p. 619 |
| Confidence Intervals | p. 621 |
| Sensitivity Analysis and Design Optimization | p. 623 |
| Defect Rate Prediction Using Monte Carlo Simulation | p. 628 |
| Additional RSM Considerations | p. 633 |
| Summary | p. 633 |
| References | p. 634 |
| Problems | p. 635 |
| Useful Formulas, Identities, Units, and Constants | p. 637 |
| Four-Port Conversions Between T- and S-Parameters | p. 641 |
| Critical Values of the F-Statistic | p. 645 |
| Critical Values of the T-Statistic | p. 647 |
| Causal Relationship Between Skin Effect Resistance and Internal Inductance for Rough Conductors | p. 649 |
| Spice Level 3 Model for 0.25 mm MOSIS Process | p. 653 |
| Index | p. 655 |
| Table of Contents provided by Ingram. All Rights Reserved. |
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