Atomic Spectroscopy in Elemental Analysis
, by Cullen, Michael- ISBN: 9781841273334 | 1841273333
- Cover: Hardcover
- Copyright: 8/1/2003
Contributors | p. xi |
Preface | p. xiii |
Method validation for atomic spectroscopy | p. 1 |
Introduction | p. 1 |
The process | p. 2 |
Create the validation plan | p. 3 |
Precision | p. 4 |
Bias | p. 10 |
Ruggedness | p. 12 |
Limit of detection, limit of quantification and selectivity | p. 13 |
The working range and linearity | p. 15 |
Equipment qualification | p. 17 |
Assessment of uncertainty | p. 19 |
Has the method met the requirements set out in the validation plan? | p. 21 |
Acknowledgements | p. 21 |
References | p. 22 |
Inductively coupled plasma mass spectrometry | p. 23 |
Introduction | p. 23 |
History and development | p. 24 |
Instrumentation | p. 24 |
Sample introduction | p. 24 |
Plasma | p. 26 |
Interface | p. 28 |
Vacuum system | p. 30 |
Ion focusing | p. 30 |
Collision cells | p. 32 |
Mass analyser | p. 35 |
Detector | p. 38 |
Operation | p. 39 |
Sample preparation and introduction | p. 39 |
Plasma optimisation | p. 40 |
Control of interferences | p. 41 |
Data acquisition | p. 44 |
Calibration and quantification | p. 45 |
Applications | p. 46 |
Environment, agriculture and food | p. 46 |
Semiconductor | p. 48 |
Clinical and pharmaceutical | p. 49 |
Geological and nuclear | p. 49 |
Forensic and archaeological | p. 50 |
Chemical, petrochemical and material testing | p. 50 |
Acknowledgements | p. 51 |
References | p. 51 |
Inductively coupled plasma atomic emission spectrometry | p. 55 |
Introduction | p. 55 |
Theory | p. 55 |
How a plasma is formed? | p. 55 |
Atomic emission theory | p. 56 |
Interferences | p. 59 |
Instrumentation | p. 61 |
Generators | p. 61 |
Line isolation devices | p. 62 |
Detectors | p. 65 |
Radial and axial ICPs | p. 68 |
Sample introduction | p. 69 |
Nebulisers and spray chambers | p. 69 |
Torches | p. 73 |
Other sample introduction methods | p. 77 |
Applications | p. 80 |
Simple applications | p. 81 |
Pre-concentration methods | p. 82 |
Speciation and coupled techniques | p. 83 |
Analysis of gases and high resolution applications | p. 85 |
Alternative plasmas | p. 85 |
Chemometrics and data manipulation | p. 86 |
Conclusions | p. 87 |
References | p. 88 |
Analytical glow discharges | p. 91 |
Introduction | p. 91 |
Basic principles of the analytical GD | p. 91 |
Introduction | p. 91 |
Typical discharge conditions of analytical GD | p. 93 |
Spatial regions in the analytical GD | p. 95 |
Species present in the analytical GD | p. 98 |
Most important collision processes in the plasma | p. 104 |
Elastic collisions | p. 106 |
Ionization and excitation of argon atoms | p. 106 |
Ionization and excitation of sputtered (analyte) atoms | p. 109 |
Positive ion-electron recombination | p. 111 |
De-excitation | p. 113 |
Processes occurring at the walls | p. 114 |
Secondary electron emission | p. 114 |
Sputtering | p. 116 |
Glow discharge optical emission spectroscopy | p. 120 |
Introduction | p. 120 |
Source and instrumental development | p. 121 |
Quantitative depth profile analysis | p. 122 |
Application of a CCD detector | p. 125 |
Radio frequency GD and interference effect | p. 127 |
Quantification approaches and measurement of electrical parameters | p. 131 |
Glow discharge mass spectrometry | p. 132 |
Source and instrumental development | p. 133 |
Instrumentation | p. 137 |
Sample preparation | p. 140 |
Quantification | p. 141 |
Analytical figures of merit | p. 143 |
Sensitivity | p. 143 |
Limit of detection | p. 143 |
Reproducibility and precision | p. 144 |
Robustness | p. 144 |
Accuracy | p. 144 |
Applications | p. 145 |
Bulk analysis of conducting and semi-conducting samples | p. 147 |
Bulk analysis of non-conducting samples | p. 148 |
In-depth analysis of surface layers | p. 148 |
Conclusion | p. 152 |
References | p. 152 |
Microwave plasma atomic emission spectroscopy | p. 157 |
Introduction | p. 157 |
Microwave-induced plasmas (MIP) | p. 157 |
MIPs as chromatographic detectors | p. 159 |
Analytical information from GC-AED | p. 166 |
GC-AED detection of non-metallic elements | p. 168 |
GC-AED detection of metallic elements | p. 172 |
Main group metallic compounds | p. 172 |
GC-AED of transition metal compounds | p. 175 |
Isotope detection by GC-AED | p. 181 |
Analytical derivatization in GC-AED | p. 182 |
Liquid and supercritical fluid chromatographic applications of AED detection | p. 183 |
The role and future development of MIP-AED chromatographic detection | p. 185 |
References | p. 185 |
X-ray fluorescence analysis (XRF) | p. 189 |
Introduction | p. 189 |
Physics of X-ray absorption and excitation | p. 189 |
Introduction | p. 189 |
Absorption | p. 190 |
The photoelectric effect | p. 191 |
Scattering of X-rays | p. 193 |
Nomenclature of characteristic X-rays | p. 194 |
The fluorescence yield | p. 194 |
Excitation of X-rays | p. 195 |
Radio-isotopes | p. 195 |
X-ray tubes | p. 196 |
Synchrotron radiation | p. 197 |
Principal components of wavelength dispersive XRF spectrometers | p. 198 |
Introduction | p. 198 |
Bragg's law for diffraction | p. 199 |
Analyzer crystal | p. 201 |
Goniometer | p. 203 |
Collimators | p. 204 |
Detectors | p. 204 |
Gas-filled detectors | p. 205 |
Scintillation detectors | p. 207 |
Other arrangements | p. 207 |
Principal components of EDS | p. 208 |
Introduction | p. 208 |
Detectors | p. 209 |
Introduction | p. 209 |
Si(Li) detectors | p. 209 |
Si-PIN detectors | p. 209 |
Si-drift chamber detectors | p. 210 |
High-resolution detectors | p. 210 |
Applications | p. 210 |
Qualitative analysis | p. 210 |
Quantitative analysis | p. 211 |
Absorption | p. 211 |
Enhancement | p. 213 |
Correction for matrix effects | p. 215 |
Fundamental parameter method | p. 215 |
Compton correction | p. 215 |
Influence coefficient algorithms | p. 216 |
Notes on specimen preparation | p. 217 |
Conclusion | p. 218 |
References | p. 218 |
Electrothermal atomic absorption spectrometry | p. 221 |
Introduction | p. 221 |
Graphite atomizers | p. 222 |
Graphite furnace analysis | p. 225 |
Drying | p. 226 |
Pyrolysis | p. 227 |
Cool-down (optional) | p. 227 |
Atomization | p. 227 |
The clean out | p. 228 |
Electrothermal atomization | p. 228 |
Interferences in graphite furnace AAS | p. 232 |
The relative merits of ETAAS | p. 237 |
References | p. 238 |
Flame atomic absorption spectroscopy, including hydride generation and cold vapor techniques | p. 239 |
Introduction | p. 239 |
Why flame atomic absorption spectrometry? | p. 239 |
The current status of FAAS | p. 240 |
Closely related techniques: hydride generation, cold vapor mercury, AFS and AES | p. 241 |
Basic principles | p. 242 |
How do FAAS instruments work? | p. 244 |
Sample introduction | p. 245 |
Nebulizers | p. 245 |
Spray chamber | p. 246 |
Flames | p. 246 |
Light sources | p. 248 |
Atom source emission | p. 250 |
Stray radiation | p. 250 |
Detectors | p. 251 |
Optical system | p. 252 |
Instruments for hydride generation | p. 253 |
Instruments for cold vapor mercury determination | p. 254 |
Instruments for AFS | p. 255 |
Limitations to performance | p. 256 |
Instrument effects | p. 257 |
Analyte effects (or why all elements do not have the same detection limit) | p. 258 |
Sample effects | p. 259 |
How to get the right answer? | p. 260 |
How to deal with interference effects? | p. 260 |
Separation and preconcentration | p. 262 |
Flow injection techniques | p. 264 |
Other possibilities for improving analytical performance | p. 264 |
Some practical points | p. 265 |
Safety | p. 265 |
Nebulizers (sensitivity drift) | p. 266 |
Light sources | p. 266 |
Calibration | p. 266 |
Achieving very low detection limits | p. 267 |
Sample preparation issues | p. 267 |
Representative applications | p. 268 |
Earth sciences | p. 268 |
Environmental | p. 270 |
Petroleum related | p. 273 |
Food and beverages | p. 274 |
Clinical and forensic | p. 276 |
Bibliography | p. 277 |
References | p. 279 |
Chemometrics in elemental analysis | p. 282 |
Introduction | p. 282 |
Experimental design and optimization | p. 282 |
Multi-variate statistics | p. 288 |
Exploratory data analysis | p. 293 |
Cluster analysis | p. 293 |
Principal components analysis | p. 295 |
Discriminant analysis | p. 299 |
Calibration models | p. 301 |
Conclusion | p. 306 |
References | p. 306 |
Index | p. 308 |
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