Handbook Of Microscopy For Nanotechnology

Note: Supplemental materials are not guaranteed with Rental or Used book purchases.

ISBN: 9781402080036 | 1402080034
Cover: Hardcover
Copyright: 3/1/2005

Rent

(Recommended)

$158.20

Term

Due

Price

Semester

Dec 11

$158.20

Quarter

Nov 8

$150.29

Short Term

Oct 9

$142.38

*This item is part of an exclusive publisher rental program and requires an additional convenience fee. This fee will be reflected in the shopping bag.
Buy New

In Stock Usually Ships in 24 Hours.

$253.16
eBook

Available Instantly

Online: 180 Days

Downloadable: 180 Days

*To support the delivery of the digital material to you, a digital delivery fee of $3.99 will be charged on each digital item.

$178.62*

Nanotechnology is a field that has and will have substantial intrinsic merit to new technology advancement and to the world economy and quality of life. Nanostructure is concerned with materials and systems whose structures and components exhibit novel physical, chemical and biological properties due to their small size. The aim is to exploit these properties by gaining control of structures and devices at atomic, molecular, and supra-molecular levels and to learn to efficiently manufacture and use these devices. The potential of this technology is almost beyond comprehension and may include applications such as systems that conduct electricity without loss, materials with orders of magnitude more strength than steel at only a small fraction of the weight, devices that store information comparable in size to the information contained in the Library of Congress so small as to fit into in a shirt pocket, and effective treatments and cures for many diseases. Microscopy

Preface

List of Contributors

xvii

I. OPTICAL MICROSCOPY, SCANNING PROBE MICROSCOPY, ION MICROSCOPY, AND NANOFABRICATION

(322)

1. Confocal Scanning Optical Microscopy and Nanotechnology

(22)

Peter J. Lu

1. Introduction

2. The Confocal Microscope

(12)

3. Applications to Nanotechnology

(5)

4. Summary and Future Perspectives

(1)

Acknowledgements

(1)

References

(4)

2. Scanning Near Field Optical Microscopy in Nanosciences

(30)

Alexandre Bouhelier, Achim Hartschuh, and Lukas Novotny

1. Scanning Near-Field Optical Microscopy and Nanotechnology

(1)

2. Basic Concepts

(1)

3. Instrumentation

(7)

4. Applications in Nanoscience

(16)

5. Perspectives

(1)

References

(4)

3. Scanning Tunneling Microscopy

(58)

Jin-Feng Jia, Wei-Sheng Yang, and Qi-Kun Xue

1. Basic Principles of Scanning Tunneling Microscopy

(4)

2. Surface Structure Determination by Scanning Tunneling Microscopy

(22)

3. Scanning Tunneling spectroscopies

(11)

4. STM-based Atomic Manipulation

(6)

5. Recent Developments

(11)

References

109

(4)

4. Visualization of Nanostructures with Atomic Force Microscopy

113

(44)

Sergei N. Magonov and Natalya A. Yerina

Introductory Remarks

113

(2)

Basics of Atomic Force Microscopy

115

(19)

Imaging of Macromolecules and their Self-Assemblies

134

(12)

Studies of Heterogeneous Systems

146

(7)

Concluding Remarks

153

(1)

References

154

(3)

5. Scanning Probe Microscopy for Nanoscale Manipulation and Patterning

157

(26)

Seunghun Hong, Jiwoon Im, Minbaek Lee and Narae Cho

1. Introduction

157

(5)

2. Nanoscale Pen Writing

162

(5)

3. Nanoscale Scratching

167

(4)

4. Nanoscale Manipulation

171

(3)

5. Nanoscale Chemistry

174

(4)

6. Nanoscale Light Exposure

178

(1)

7. Future Perspectives

179

(1)

References

180

(3)

6. Scanning Thermal and Thermoelectric Microscopy

183

(24)

Li Shi

1. Introduction

183

(1)

2. Instrumentation of Scanning Thermal and Thermoelectric Microscopy

184

(7)

3. Theory of Scanning Thermal and Thermoelectric Microscopy

191

(6)

4. Applications of Scanning Thermal and Thermoelectric Microscopy in Nanotechnology

197

(6)

5. Summary and Future Aspects

203

(1)

Acknowledgements

204

(1)

References

204

(3)

7. Imaging Secondary Ion Mass Spectrometry

207

(20)

William A. Lamberti

1. Secondary Ion Mass Spectrometry and Nanotechnology

207

(1)

2. Introduction to Secondary Ion Mass Spectrometry

208

(5)

3. Experimental Issues in Imaging SIMS

213

(3)

4. Applications in Nanotechnology

216

(4)

5. Summary and Future Perspectives

220

(2)

References

222

(5)

8. Atom Probe Tomography

227

(20)

M.K. Miller

1. Atom Probe Tomography and Nanotechnology

227

(1)

2. Instrumentation of Atom Probe Tomography

228

(9)

3. Basic Information

237

(1)

4. Data Interpretation and Visualization

238

(6)

5. Sample Analysis of Nanomaterials: Multilayer Films

244

(1)

6. Summary and Future Perspectives

245

(1)

Acknowledgements

245

(1)

References

246

(1)

9. Focused Ion Beam Systems-A Multifunctional Tool for Nanotechnology

247

(40)

Nan Yao

1. Introduction

247

(3)

2. Principles and Practice of the Focused Ion Beam System

250

(16)

3. Application of Focused Ion Beam Instrumentation

266

(18)

Acknowledgements

284

(1)

References

284

(3)

10. Electron Beam Lithography

287

(36)

Zhiping (James) Zhou

1. Electron Beam Lithography and Nanotechnology

287

(2)

2. Instrumentation of Electron Beam Lithography

289

(11)

3. Electron-Solid Interactions

300

(6)

4. Pattern Transfer Process

306

(4)

5. Applications in Nanotechnology

310

(8)

6. Summary and Future Perspectives

318

(1)

References

319

(4)

II. ELECTRON MICROSCOPY

323

(394)

11. High Resolution Scanning Electron Microscopy

325

(36)

Jingyue Liu

1. Introduction: Scanning Electron Microscopy and Nanotechnology

325

(4)

2. Electron-Specimen Interactions

329

(5)

3. Instrumentation of the Scanning Electron Microscope

334

(8)

4. The Resolution of Secondary and Backscattered Electron Images

342

(3)

5. Contrast Mechanisms of SE and BE Images of Nanoparticles and Other Systems

345

(7)

6. Applications to Characterizing Nanophase Materials

352

(3)

7. Summary and Perspectives

355

(3)

References

358

(3)

12. High-Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials

361

(40)

Dale E. Newbury, John Henry J. Scott, Scott Wight, and John A. Small

1. Introduction

361

(1)

2. The Nanomaterials Characterization Challenge: Bulk Nanostructures and Discrete Nanoparticles

362

(2)

3. Physical Basis of the Electron-Excited Analytical Spectrometries

364

(2)

4. Nanoscale Elemental Characterization with High Electron Beam Energy

366

(4)

5. EELS Quantification

370

(1)

6. Spatial Sampling of the Target with EELS

371

(8)

7. Nanoscale Elemental Characterization with Low and Intermediate Electron Beam Energy

379

(11)

8. Examples of Applications to Nanoscale Materials

390

(9)

9. Conclusions

399

(1)

References

399

(2)

13. Characterization of Nano-Crystalline Materials using Electron Backscatter Diffraction in the Scanning Electron Microscope

401

(26)

J.R. Michael

1. Introduction

401

(1)

2. Historical Development of EBSD

402

(1)

3. Origin of EBSD Patterns

403

(5)

4. Resolution of EBSD

408

(5)

5. Sample Preparation of Nano-materials for EBSD

413

(2)

6. Applications of EBSD to Nano-materials

415

(9)

7. Summary

424

(1)

Acknowledgements

424

(1)

References

424

(3)

14. High-Resolution Transmission Electron Microscopy

427

(28)

David J. Smith

1. HRTEM and Nanotechnology

427

(1)

2. Principles and Practice of HRTEM

428

(6)

3. Applications of HRTEM

434

(9)

4. Current Trends

443

(5)

5. Ongoing Problems

448

(1)

6. Summary and Future Perspective

449

(1)

References

450

(5)

15. Scanning Transmission Electron Microscopy

455

(38)

J.M. Cowley

1. Introduction

455

(4)

2. STEM Imaging

459

(6)

3. STEM Imaging of Crystals

465

(4)

4. Diffraction in STEM Instruments

469

(4)

5. Microanalysis in STEM

473

(1)

6. Studies of Nanoparticles and Nanotubes

474

(1)

7. Studies of Crystal Defects and Interfaces

475

(2)

8. The Structure and Composition of Surfaces

477

(3)

9. Amorphous Materials

480

(2)

10. STEM Holography

482

(2)

11. Ultra-High-Resolution STEM

484

(3)

12. Conclusions

487

(1)

Acknowledgements

488

(1)

References

488

(5)

16. In-Situ Electron Microscopy for Nanomeasurements

493

(38)

Zhong Lin Wang

1. Introduction

493

(2)

2. Thermal Induced Surface Dynamic Processes of Nanocrystals

495

(1)

3. Measuring Dynamic Bending Modulus By Electric Field Induced Mechanical Resonance

496

(10)

4. Young's Modulus of Composite Nanowires

506

(2)

5. Bending Modulus of Oxide Nanobelts

508

(4)

6. Nanobelts as Nanocantilevers

512

(1)

7. In-situ Field Emission from Nanotube

513

(1)

8. Work Function at the Tips of Nanotubes and Nanobelts

513

(4)

9. Mapping the Electrostatic Potential at the Nanotube Tips

517

(1)

10. Field Emission Induced Structural Damage

518

(3)

11. Nanothermometer and Nanobearing

521

(1)

12. In-situ Transport Measurement of Nanotubes

521

(7)

13. Summary

528

(1)

Acknowledgement

528

(1)

References

529

(2)

17. Environmental Transmission Electron Microscopy in Nanotechnology

531

(36)

Renu Sharma and Peter A. Crozier

1. Introduction

531

(1)

2. History of ETEM

532

(6)

3. Data Collection

538

(3)

4. Experimental Design Strategies

541

(2)

5. Applications to Nanomaterials

543

(19)

6. Conclusions

562

(1)

References

563

(4)

18. Electron Nanocrystallography

567

(34)

Jian-Min Zuo

1. Introduction

567

(1)

2. Electron Diffraction Modes and Geometry

568

(4)

3. Theory of Electron Diffraction

572

(12)

4. Experimental Analysis

584

(6)

5. Applications to Nanostructure Characterization

590

(8)

6. Conclusions and Future Perspectives

598

(1)

References

598

(3)

19. Tomography using Transmission Electron Microscope

601

(28)

P.A. Midgley

1. Introduction

601

(2)

2. Tomography

603

(6)

3. Tomography in the Electron Microscope

609

(6)

4. STEM HAADF (Z-Contrast) Tomography

615

(6)

5. EFTEM Tomography

621

(2)

6. Conclusions

623

(1)

Acknowledgements

624

(1)

References

624

(5)

20. Off-Axis Electron Holography

629

(24)

Martha R. McCartney, Rafal E. Dunin-Borkowski and David J. Smith

1. Electron Holography and Nanotechnology

629

(1)

2. Description of Off-Axis Electron Holography

630

(8)

3. Nanoscale Electrostatic Fields

638

(5)

4. Nanoscale Magnetic Fields

643

(5)

5. Future Perspectives

648

(1)

References

649

(4)

21. Sub-nm Spatially Resolved EELS (Electron Energy-Loss Spectroscopy): Methods, Theory and Applications

653

(30)

Christian Colliex and Odile Stéphan

1. Introduction: EELS and Nanotechnology

653

(2)

2. Understanding the Information Contained in an EELS Spectrum

655

(8)

3. Spatially Resolved EELS

663

(6)

4. Elemental Mapping of Individual Nanoparticles using Core-Loss Signals

669

(5)

5. Mapping Bonding States and Electronic Structures with ELNES Features

674

(4)

6. Conclusion

678

(1)

References

679

(4)

22. Imaging Magnetic Structures using Transmission Electron Microscopy Methods

683

(34)

Takayoshi Tanji

1. Introduction

683

(1)

2. Lorentz Microscopy

684

(13)

3. Electron Holography

697

(16)

4. Summary

713

(1)

References

714

(3)

Index

717

FREE SHIPPING

Rent More, Save More! Use code: BBRENTAL

5% off 1 book, 7% off 2 books, 10% off 3+ books

Handbook Of Microscopy For Nanotechnology

Summary

Table of Contents

Supplemental Materials