Handbook of Optical Systems, Volume 5 Metrology of Optical Components and Systems

Herbert Gross, born in 1955, joined Carl Zeiss in 1982 after finishing his physics degree as specialist for optical design. Since 1995 he has been working as head of the department of optical design, while also teaching as a lecturer in Aalen and Lausanne. The new handbook is an intuitive, didactically elegant approach to the subject of optical systems and is not competed by any other work on the market. The selected board of authors, all reputed industrial experts, guarantee the timeliness of the well coordinated, coherent chapters. The topics of the fifth volume comprise the methods of measuring the properties of optical systems. The different fundamental techniques, such as propagation measurement and polarimetry, are introduced and discussed in detail and clarity. The presentation allows the reader, after having devised an optical system, to perform the measurements best suited to ascertain that the system fulfills the specific needs and requirements. The following chapters provide a survey on materials, coatings and surfaces of optical components, and combine this with a treatment of light and radiation. The book thus serves as a one-stop reference for metrology of optical systems.

Herbert Gross studied physics at the University of Stuttgart, Germany, and joined Carl Zeiss in 1982, where has since been working in the department of optical design. His special areas of interest are the development of simulation methods, optical design software and algorithms, the modeling of laser systems and simulation of problems in physical optics, and the tolerance and the measurement of optical systems. Since 1995, he has been head of the central optical design department at Zeiss. In 1995, he received his PhD at the University of Stuttgart, Germany, on the modeling of laser beam propagation in the partial coherent region.

Volume 5: Metrology of Optical Components and Systems 52 Introduction 53 Interferometry 54 Photometry and spectrometry 55 Image geometry 56 Principles of measuring image quality 57 Propagation measurement techniques 58 Polarimetry 59 Materials 60 Geometry of conventional components 61 Special components 62 Coatings 63 Surface imperfections 64 Lightsources and radiation 65 Basic parameter of systems 66 Image quality of systems