Improved Analysis of DNA Short Tandem Repeats With Time-of-flight Mass Spectrometry

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Improved Analysis of DNA Short Tandem Repeats With Time-of-flight Mass Spectrometry by Butler, John M.; Becker, Christopher H.; U. S. Department of Justice; Office of Justice Programs; National Institute of Justice, 9781478268017
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  • ISBN: 9781478268017 | 1478268018
  • Cover: Paperback
  • Copyright: 7/18/2012

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