Introduction to Scanning Tunneling Microscopy

C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York

C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York, USA.

Please visit the author's homepage for more information. [add URL as in the HB webpage: http://www.columbia.edu/~jcc2161/]

1. Overview
Part I
PRINCIPLES
2. Tunneling Phenomena
3. Tunneling Matrix Elements
4. Atomic forces
5. Atomic Forces and Tunneling
6. Nanometer-Scale Imaging
7. Atomic-Scale Imaging
8. Nanomechanical Effects
Part II
INSTRUMENTATION
9. Piezoelectric Scanners
10. Vibration Isolation
11. Electronics and Control
12. Mechanical Design
13. Tip Treatment
14. Scanning Tunneling Spectroscopy
15. The Atomic Force Microscope
16. Illustrative Applications
APPENDICES
A. Green's Functions
B. Spherical Modified Bessel Functions
C. Surface symmetry
D. Elementary elasticity theory