Microbeam Analysis: Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000

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ISBN: 9780750306850 | 0750306858
Cover: Hardcover
Copyright: 1/1/2000

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Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.

IUMAS President's Address

IUMAS Program Committee

vii

Scholarship Winners

Sponsors

Plenary symposium

The role of microanalysis in the characterization of interfaces

(2)

M Ruhle

C Elsasser

C Scheu

W Sigle

Nanotechnology: promises and challenges for tomorrow

(2)

A D Romig Jr

J R Michael

T A Michalske

Light microscopy---without lasers, fourier transforms etc

(2)

W C McCrone

Recent progress in Monte Carlo simulation approach to microbeam analysis

(2)

R Shimizu

Symposium 1: 30 years of optical spectroscopy

Historical developments, state of the art and perspectives of Raman microspectroscopy and microscopy

(2)

P Dhamelincourt

Effective designs of Raman microprobes for confocal and near-field performance

(2)

S Webster

G D Pitt

D N Batchelder

High resolution Raman images of stress in bonded silicon microstructures

(2)

D J Gardiner

M Bowden

Raman microspectroscopy and imaging as probes for the response of bone tissue to mechanical stress

(2)

A Carden

M D Morris

Micro-Raman spectroscopy of photonic device materials: group theory and polarization selection rules

(2)

D D Tuschel

Linear and nonlinear Raman spectroscopy on single microdroplets

(2)

W Kiefer

J Popp

V E Roman

O Sbanski

Spectroscopy of organic and biological single particles on nanometer and micrometer scales using a near-infrared laser Raman trapping system

(2)

K Ajito

K Torimitsu

Visible/near IR Raman and photoluminescence microspectroscopy using CCD and InGaAs dual detectors

(2)

F Adar

A Whitley

M Leclercq

M Moreau

J Rebello

H Reich

Raman imaging of semiconductor materials: characterization of static and dynamic properties

(2)

S Nakashima

H Harima

Characterization of carrier and stress distributions in semiconductor devices by cathodoluminescence spectroscopy and Raman microprobe

(2)

M Yoshikawa

R Sugie

G Katagiri

Single-pass spectroscopic and Raman imaging systems---the new developments

(2)

G D Pitt

Detection of interstitial molecules and observation of their micro-segregation using cathodoluminescence microanalysis

(2)

M A Stevens Kalceff

Confocal Raman microscopy---why the depth resolution is much worse than you think! Modelling and measuring the effect of refraction in transparent media

(2)

N Everall

Integrated spectroscopic imaging: applications using micro X-ray fluorescence, micro Raman and micro infrared

(2)

G J Harvilla

J R Schoonover

Current state of the art in Raman microscopy and chemical imaging

(2)

P J Treado

M P Nelson

T H Myers II

Development of infrared microspectroscopy instrumentation and applications

(2)

J A Reffner

FTIR-microspectroscopy of polymers advances into the 21st century!

(2)

J M Chalmers

N J Everall

M D Schaerberle

I W Levin

E N Lewis

L H Kidder

M Pearson

M A Chesters

L Bozec

H M Pollock

A Hammiche

FTIR imaging of phase-separated polymeric systems

(2)

J L Koenig

S-Q Wang

R Bhargava

Microanalysis of human matrices for foreign substances

(2)

K S Kalasinsky

V F Kalasinsky

FTIR photoacoustic spectral depth profiling: putting A G Bell's discovery to work in analytical materials science

(2)

R A Palmer

Analysis of laminates, compositional gradients and isolated regions in polymers by Raman and infrared microscopy

(2)

M Smith

K Kempfert

M Longmire

F Deck

E Y Jiang

Resolution limits for scanning infrared microspectroscopy: theory and practice

(2)

G L Carr

M Ramotowski

L M Miller

`What are the next steps?'---Beyond the current use of FT-IR and FT-Raman biochemical images

(2)

C P Schultz

Multivariate Raman microscopy: application to biological materials and synthetic materials

(2)

M D Morris

C P Tarnowski

J A Timlin

Light scattering and Raman spectroscopy for biomedical analysis and disease diagnosis

(2)

R R Dasari

M S Feld

Infrared microscopic analysis of skin: a comparison of methodologies

(2)

M Jackson

FT-IR microspectroscopy of cells and tissues

(2)

D Naumann

J Kneipp

C Kirschner

N A Ngo Thi

P Lasch

In vivo Raman spectroscopy

(2)

G J Puppels

Infrared microbeam analysis of intricate biological specimens

(2)

D L Wetzel

S M LeVine

Inside living cells: a new vision through optical micro- and nano-spectroscopies

(2)

G D Sockalingum

H Morjani

F Lei

M Manfait

Optical spectroscopy and imaging: application to detection of early gastrointestinal cancer

(2)

B C Wilson

R DaCosta

M Shim

L Lilge

N Marcon

L M WongKee Song

Analysis of the orientational nature of molecules and crystals within biomaterials using Raman microspectroscopy

(2)

E Wentrup-Byrne

C A Armstrong

R S Armstrong

New applications and analytical methods for vibrational spectroscopic imaging

(2)

E N Lewis

A S Haka

I W Levin

L H Kidder

Applications of synchrotron infrared microspectroscopy to the study of biological cells and tissues

(2)

L M Miller

P Dumas

N Jamin

J L Teillaud

J L Bantignies

G L Carr

Infrared microspectroscopy of cells and tissue: infrared spectra and infrared spectral maps of human tissues

(2)

M Diem

L Chiriboga

A Pacifico

H Yee

Comparison of FTIR microspectroscopy methods for analysis of breast tissue samples

(2)

R K Dukor

G M Story

C Marcott

A new portable Raman imaging probe

(2)

T Ikeda

H Tashiro

Y Ozaki

A study of the phase behaviour of polyethylene blends using micro-Raman imaging

(2)

A van der Pol

R L Morgan

B J Kip

R Ottjes

J van Ruiten

M J Hill

P J Barham

Raman microscopy in art and archaeology: illumination of historical mysteries

(2)

H G M Edwards

F Rull Perez

A R David

High-pressure infrared synchrotron and Raman microspectroscopy of Earth and planetary materials

(2)

R J Hemley

A F Goncharov

Z Liu

H K Mao

S Merkel

Raman microscopy as a non-destructive method for the analysis of minerals

(2)

J T Kloprogge

R L Frost

Advances in fiber-coupled Raman microprobes and chemical mapping

(2)

I R Lewis

J M Shaver

M L Samford

Raman microscopy of kaolinite phases expanded through intercalation with potassium acetate

(2)

R L Frost

J T Kloprogge

Multi-channel confocal micro-Raman spectroscopy of minerals and glasses at ambient and high pressures

(2)

S K Sharma

T F Cooney

Confocal laser-Raman microprobe analysis of radiation-damaged minerals

(2)

L Nasdala

M Wenzel

Effect of signal-to-noise ratio on multivariate curve resolution of Raman spectroscopic image data

(2)

S L Zhang

T M Hancewicz

J J Andrew

Field and routine laboratory use of Raman spectroscopy for mineral identification: applications to rocks

101

(2)

L A Haskin

A Wang

B L Jolliff

Development of a flight Raman spectrometer for the ``Athena'' rover scientific instrument payload for Mars Surveyor missions

103

(2)

A Wang

L A Haskin

Evaluation of multi-channel micro-Raman spectrometry for rock analysis

105

(2)

P Deb

C H Chio

S K Sharma

D W Muenow

New instrumental approaches for vibrational spectroscopic imaging

107

(2)

L H Kidder

K S Haber

E N Lewis

Quantitation of composition in inhomogeneous polymers with NEXAFS microscopy

109

(2)

H Ade

Segregated phases in flexible polyurethanes by X-ray spectromicroscopy

111

(2)

E Rightor

S Urquhart

A Hitchcock

H Ade

G Mitchell

M T Dineen

F Hayes

R Priester

W Lidy

Characterization of microscopic variation in crosslink density in polymer gels using scanning transmission X-ray microscopy

113

(2)

G Mitchell

L R Wilson

E G Rightor

M T Dineen

F Hayes

S Urquhart

A Hitchcock

H Ade

Near-field Raman spectroscopy: electric field gradient effects

115

(2)

E J Ayars

M A Paesler

H D Hallen

Design and application of an ultra-high spatial resolution mapping system using near-field spectroscopy

117

(2)

T Ikeda

Y Narita

T Williams

M Ohtsu

Confocal optical imaging in highly scattering media: quantification using photon time-of-flight measurements

119

(2)

D H Burns

W F Long

C E W Gributs

Raman intensity calibration with glass luminescence standards

121

(2)

E S Etz

W S Hurst

S J Choquette

Modulations used to transmit information in spectrometry and imaging

123

(2)

W G Fateley

R M Hammaker

R A DeVerse

R R Coifman

Symposium 2: Advances in X-ray instrumentation

Microcalorimeter EDS for low voltage microanalysis

125

(2)

D A Wollman

D E Newbury

S W Nam

G C Hilton

K D Irwin

D A Rudman

S Deiker

N F Bergren

J M Martinis

Design and principles of high resolution microcalorimeter type X-ray spectrometers

127

(2)

J Hohne

M Buhler

T Hertrich

U Hess

Applications of high resolution microcalorimeter type X-ray spectrometers in material analysis

129

(2)

J Hohne

M Buhler

T Hertrich

U Hess

Monochromatic X-ray microprobe using doubly curved crystals

131

(2)

Z W Chen

M W McColgan

D M Gibson

Small area analysis using micro-diffraction techniques

133

(2)

R P Goehner

R G Tissot

J R Michael

XRMF with capillary optics and low-power micro-focus source

135

(2)

D A Carpenter

The application of polycapillary X-ray lens in XRF microanalysis

137

(2)

Y Yan

X Ding

Q Pan

Y He

Development of the multi-energy X-ray generation system with higher intensity than that of synchrotron radiation for X-ray photoelectron diffraction measurements

139

(2)

H Ishii

S Shiraki

S Omori

M Owari

M Doi

S Kojima

E Yamada

S Takahashi

K Tsukamoto

T Koshikawa

Y Nihei

Symposium 3: X-ray microanalysis of thin specimens

Modification of -factor method for quantitative X-ray microanalysis in analytical electron microscopy

141

(2)

T Fujita

M Watanabe

Z Horita

Information obtained by X-ray mapping large sample areas in a FEGSTEM

143

(2)

A J Papworth

D B Williams

Compositional mapping of nanolayered metal composites

145

(2)

V J Keast

H Kung

A Misra

T E Mitchell

Automated unbiased information extraction of STEM-EDS spectrum images

147

(2)

P G Kotula

M R Keenan

STEM X-ray elemental mapping of a cermet Cu-Al2O3 (5 wt%) produced by in-situ reduction

149

(2)

M S Motta

I G Solorzano

E A Brocchi

P K Jena

Atomic structural environment of grain boundary segregated Y in creep resistant alumina

151

(2)

C M Wang

G S Cargill III

H M Chan

M P Harmer

D B Williams

Investigation of self-absorption correction in thin foil EDS by spectrum modelling

153

(2)

J M Titchmarsh

Theoretical simulation of probe sizes for microanalysis in AEM

155

(2)

M Watanabe

D B Williams

Analytical electron microscopy of SmFeTaN-based permanent-magnet materials

157

(2)

G Drazic

P McGuiness

K Zuzek

S Kobe

ALCHEMI for interstitial and sublattice site identification

159

(2)

C J Rossouw

The application of AEM and APFIM to the analysis of precipitation behavior in alloy 718

161

(2)

M G Burke

M K Miller

Interface analysis of Si-Al-O-N materials by a 300kV FE-TEM

163

(2)

F F Xu

C M Wang

Y Bando

M Mitomo

Microstructural and micro-compositional analysis of WC/Co composities, prepared by microwave and conventional thermal sintering

165

(2)

A J Papworth

H Jain

D K Agrawal

J Cheng

D B Williams

Microanalytical characterization of second phases in melt spun Mg-1.5wt%Ca-6wt%Zn alloys

167

(2)

P M Jardim

I G Solorzano

J B Vander Sande

B S You

TZP-based composites---an analytical approach

169

(2)

M Faryna

K Haberko

Microcharacterization of composite membranes of electrospun nanofibers and microparticles

171

(2)

D Ziegler

C Sung

T Dolukhanyan

H L Schreuder-Gibson

Microanalysis of neutron-irradiated fuel cladding materials

173

(2)

D M Farkas

R W Warner

A study on the carbide precipitation in a ferritic steel

175

(2)

J G Nawrocki

J N DuPont

A R Marder

STEM analysis of FIB damage in silicon

177

(2)

C Urbanik Shannon

B I Prenitzer

L A Giannuzzi

S R Brown

T L Shofner

B Rossi

C A Vartuli

R B Irwin

F A Stevie

Cross-sectional TEM of ceramic interfaces and layers

179

(2)

D R G Mitchell

C J Barbe

D J Cassidy

D J Attard

Symposium 4: Biological microanalysis

Imaging of molecular and atomic distributions in biological specimens at high spatial resolution

181

(2)

F P Ottensmeyer

J A Davis

Y M Heng

M M G Barfels

Data acquisition strategies for determination of subsarcomere Ca distributions using EPXMA

183

(2)

M E Cantino

J G Eichen

S B Daniels

Strategies for optimizing detection limits in elemental mapping of biological specimens by electron energy-loss spectrum-imaging

185

(2)

R D Leapman

S B Andrews

Proposal of an electron microscope for biological sample observation

187

(2)

H Suga

M Kotera

Analytical electron microscopy---an ultimate tool for exploring the environmental living conditions 5300 years ago and nowadays

189

(2)

M A Pabst

C Mitterbauer

I Papst

F Hofer

Ion microscopy of fresh frozen dried cryosections for ion images

191

(2)

K Takaya

L He

M Okabe

Symposium 5: Convergent beam and electron backscatter diffraction

Characterization of deformed microstructures by OIM

193

(2)

H Weiland

D P Field

An economical approach to miniaturize electron back-scattering diffraction system in a SEM

195

(2)

V Thaveeprungsriporn

D Thong-Aram

The past and future of convergent-beam diffraction

197

(2)

J A Eades

Symmetry breakdown in HOLZ lines from the L12 phase of Al3Ti

199

(2)

C J Rossouw

K Tsuda

Advances in symmetry analysis by convergent-beam electron diffraction

201

(2)

M Terauchi

M Tanaka

Ab-initio primitive cell calculations from EBSD patterns

203

(2)

J R Michael

R P Goehner

Developments in quantitative convergent beam electron diffraction (CBED)

205

(2)

M Saunders

A comparison of lattice-source and divergent-beam X-ray interferences as well as electron backscattering diffraction for the determination of crystal parameters

207

(2)

S Dabritz

E Langer

W Hauffe

OIM and EDX determination of the orientation dependence of corrosion in uranium metal

209

(2)

D A Carpenter

J S Bullock IV

Symposium 6: Electron energy-loss spectroscopy

High energy-resolution electron energy-loss spectroscopy based on electron microscopy

211

(2)

M Terauchi

M Tanaka

High brightness monochromator for STEM

213

(2)

P E Batson

H W Mook

P Kruit

Energy filtering in UHV reflection electron microscopy

215

(2)

Y Tanishiro

T Suzuki

N Ishiguro

H Minoda

K Yagi

An 0.2eV energy resolution analytical electron microscope

217

(2)

M Tanaka

M Terauchi

K Tsuda

K Saitoh

T Honda

K Tsuno

M Naruse

T Tomita

T Kaneyama

The end of the road for silicon dioxide---and beyond: characterizing gate dielectrics for atomic-scale transistors

219

(2)

D A Muller

J Rosamelia

T Sorsch

K Evans-Lutterodt

G Timp

J Neaton

STEM-EELS analysis of advanced semiconductor materials

221

(2)

B Foran

D Brazeau

J Bennett

Electron energy-loss (EELS) spectroscopic profiling of microelectronic devices

223

(2)

J Bruley

P Flaitz

Electron energy loss spectrometry on lithiated graphite

225

(2)

A Hightower

C C Ahn

B Fultz

HRTEM and EELS study of carbon and boron nitride cones

227

(2)

L Bourgeois

Y Bando

W Q Han

T Sato

Quantitative composition mapping by EFTEM

229

(2)

J Bentley

Energy-filtered imaging and growth mechanism of YBa2Cu3O7-δ ultrathin films

231

(2)

W Grogger

M Varela del Arco

C Ballesteros

K Krishnan

STEM-EELS study of catalysts composed of ultrafine gold particles

233

(2)

T Akita

K Tanaka

M Haruta

EELS investigation of CVD α-Al2O3 κ-Al2O3 and γ-Al2O3 coatings

235

(2)

A Larsson

J Zackrisson

M Halvarsson

S Ruppi

Quantitative electron energy-loss spectroscopy and imaging of a Ti(C,N) based cermet material

237

(2)

J Zackrisson

W Grogger

Investigating the electronic structure of defects and interfaces using atomic resolution EELS

239

(2)

N D Browning

E M James

Y Xin

I Arslan

Atomic scale characterization of oxygen-deficient ceramic membranes by EELS and Z-contrast imaging

241

(2)

R F Klie

Y Ito

N D Browning

S Stemmer

T J Mazanec

Towards single atom column EELS in an aberration-corrected STEM

243

(2)

S J Pennycook

B Rafferty

G Duscher

Symposium 7: Variable pressure and low voltage scanning electron microscopy

On the contrast and resolution of backscattering images in the FE-SEM

245

(2)

R Gauvin

Recent developments in low-voltage imaging and microanalysis of heterogeneous catalysts in the FE-SEM

247

(2)

J Liu

Quantitative measurement of field emission scanning electron microscope (FESEM) spatial resolution

249

(2)

D Drouin

V Aimez

J Fraser

P Poole

J Beauvais

J Beerens

A new type of electron energy analysis system with a low-energy electron point source

251

(2)

T Ishikawa

N Endo

M Goto

C Oshima

H Iwai

Application of petroleum geology by SEM & EDS

253

(2)

C Yin

A study of FIB irradiation damage by low voltage microanalysis

255

(2)

T C Baroni

B J Griffin

F J Lincoln

Off-axis electron holography of field emission nanotips

257

(2)

B G Frost

D C Joy

Dynamic LEEM observation of Cu nanostructure formation processes on Si(111) with and without hydrogen

259

(2)

T Koshikawa

T Yasue

M Jalochowski

E Bauer

Secondary electron spectroscopy

261

(2)

D C Joy

D Braski

Low voltage and low vacuum-imaging and X-ray microanalysis

263

(2)

B J Griffin

J R Browne

T C Baroni

Irradiation induced specimen damage in an environmental scanning electron microscope

265

(2)

M A Stevens Kalceff

Analysis of conjugated polymer multilayer structures in the environmental SEM

267

(2)

I C Bache

D S Thomas

A M Donald

Charging phenomena of wide bandgap materials in a VP-SEM

269

(2)

G Remond

C E Nockolds

M R Phillips

J Cazaux

Combined seconday and backscattered electron detector for variable pressure scanning electron microscopes (VPSEM)

271

(2)

D Drouin

V Aimez

X Hugon

B J Griffin

J Beauvais

J Beerens

Charge neutralization of insulators in an ESEM

273

(2)

M R Phillips

M Toth

Charge contrast in SE images obtained using the ESEM

275

(2)

M Toth

M R Phillips

S O Kucheyev

J S Williams

C Jagadish

G Li

Symposium 8: Monte Carlo simulations

A Monte Carlo study of EPMA of porous alumina

277

(2)

C Merlet

L Sorbier

E Rosenberg

F Salvat

Monte Carlo simulation study of secondary electron emission and surface excitation

279

(2)

Z J Ding

R Shimizu

Analysis of primary energy dependence of secondary electron polarization

281

(2)

M Yasuda

K Tamura

H Kawata

K Murata

Monte Carlo model of charging in resists in e-beam lithography and metrology

283

(2)

Y-U Ko

J J Hwu

D C Joy

X-ray emission from rough surfaces

285

(2)

R Gauvin

E Lifshin

Simulation of electron scattering for the Mott polarimeter

287

(2)

K Tamura

M Yasuda

K Murata

M Kotera

Development of Monte Carlo simulation of characteristic and continuum X-ray generation by electron impact

289

(2)

T Nagatomi

K Fujii

Y Kimura

Y Takai

R Shimizu

T Yurugi

K Obori

Quantitative electron microprobe analysis of thin films on substrates

291

(2)

S Yamauchi

M Yasuda

K Murata

Applications of Monte Carlo simulation of electron scattering to electron probe microanalysis of alloys

293

(2)

K Murata

S Yamauchi

The potential of Monte Carlo calculations for quantitative analysis

295

(2)

E Lifshin

R Gauvin

Symposium 9: Particle microanalysis

A three dimensional view of basalt crystallization in ``lava straws'' from Kilauea

297

(2)

G P Meeker

C R Thornber

A new method for EPMA of individual micro-particles in a matrix

299

(2)

A Berner

O Sideleva

The improvement of the individual particle analysis of suspended particulate matter (SPM) at urban site atmosphere with EPMA

301

(2)

B Kim

B Tomiyasu

M Owari

Y Nihei

Challenges and new directions in the microanalysis of particles, defects and other small structures in the semiconductor industry

303

(2)

A L Testoni

Improving the accuracy of particle analysis

305

(2)

J A Small

J R Michael

D E Newbury

Analysis of small extraterrestrial particles

307

(2)

D E Brownlee

Natural ``fly ash'' from the Kilauea volcano, Hawaii

309

(2)

G P Meeker

C R Thornber

T K Hinkley

Microbeam characterisation of nano-precipitates in steel

311

(2)

H Dillen

G Dupuis

C Xhoffer

A De Vyt

Symposium 10: Surface analysis

Hetero-epitaxial double-atomic-layer system of monolayer graphene/monolayer h-BN on Ni(111) studied by HREELS

313

(2)

C Oshima

A Itoh

E Rokuta

N Tanaka

K Yamashita

Dependencies of secondary electron yields on work function for metals by electron and ion bombardment

315

(2)

M Kudo

Y Sakai

T Ichinokawa

Quantum conductance and electron field emission of carbon nanotubes

317

(2)

Z L Wang

Z G Bai

R P Gao

Z R Dai

P Poncharal

W A de Heer

Surface analysis at high temperatures as applied to Sc-O/W(100) system

319

(2)

T Kawano

Y Takai

R Shimizu

Vibrational spectra of two systems: monolayer hexagonal boron nitride/fcc-iron/Ni(111) and hexagonal boron nitride/monolayer graphene/Ni(111)

321

(2)

T Tanaka

A Itoh

K Yamashita

A Tajima

E Rokuta

C Oshima

Symposium 11: Secondary ion mass spectrometry

Challenges in ultra-high depth resolution profiling of semiconductor materials by SIMS

323

(2)

J Bennett

Advanced sample preparation techniques for SIMS analysis of semiconductor materials

325

(2)

F A Stevie

T L Shofner

F Hillion

H Francois-Saint-Cyr

T Kimble

E Elshot

K A Richardson

Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants

327

(2)

J L Hunter

T B Bates

S B Patel

R Loesing

G Guraynov

D P Griffis

In situ ion implantation for trace quantitative SIMS analysis of wide-band gap (WBG) electronic device materials

329

(2)

R T Lareau

M Wood

F Chmara

SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification

331

(2)

R Gijbels

G Verlinden

I Geuens

Organic particle analysis using time-of-flight secondary ion mass spectrometry

333

(2)

S M Hues

Surface OH group governing adsorption property and surface reactivity on the top and bottom faces of float glass

335

(2)

Y Hayashi

M Kudo

ToFSIMS and laser post-ionisation imaging of biomolecules at high spatial resolution

337

(2)

N P Lockyer

J C Vickerman

Secondary ion mass spectrometry using polyatomic and cluster primary ion beams

339

(2)

G Gillen

Isotopic imaging by dynamic SIMS ion microscopy in biology and medicine

341

(2)

S Chandra

Development of nano-scale FIB SIMS apparatus

343

(2)

M Nojima

B Tomiyasu

T Shibata

M Owari

Y Nihei

Highly reliable quantitative analysis with Ga-FIB SIMS measurement by simultaneous multi-element detection system

345

(2)

B Tomiyasu

M Owari

Y Nihei

A novel apparatus for three-dimensional microanalysis using ion and electron dual focused beams

347

(2)

T Sakamoto

K Takanashi

Zh H Cheng

N Ono

H Wu

M Owari

Y Nihei

The laser ablation ICP-MS trace element microprobe: methods development for analysis of geologic materials

349

(2)

W I Ridley

P J Aruscavage

S A Wilson

Characterization of the electron beam specimen interaction in the ESEM with SIMS imaging

351

(2)

S A Wight

G Gillen

G B Saupe

Effects of incident angle and target rotation on SIMS crater roughening

353

(2)

L A Giannuzzi

B I Prenitzer

J M McKinley

F A Stevie

Three-dimensional microanalysis of the wire-pad contact region of integrated circuit

355

(2)

K Takanashi

H Wu

N Ono

Zh H Cheng

T Sakamoto

M Owari

Y Nihei

Application of SIMS to condensation dust sample in flue gas

357

(2)

S Oishi

M Shirahase

R Oiwa

K Kusama

Improvements to SIMS in-depth profile resolution with a new rotational stage

359

(2)

M C Wood

R T Lareau

M H Ervin

Real time monitoring of hydrogen-surfactant effect using ion scattering and recoiling spectroscopy in gas phase atmosphere

361

(2)

K Oura

T Fujino

M Katayama

Y Yamazaki

S Inoue

J-T Ryu

Nuclear microprobe analysis of beam-processed miniaturized structures by focused ion and electron beams

363

(2)

M Takai

O Yavas

C Ochiai

Y K Park

Symposium 12: Scanning probe microscopy/nanomechanics

Studies of the nanomechanical properties of Au thin films by interfacial force microscopy

365

(2)

J E Houston

Scratching and healing investigations on self-assembled monolayers using atomic force microscopy

367

(2)

B R A Neves

M E Salmon

D N Leonard

E B Troughton Jr

P E Russell

Touching on the nanometer scale: slip, roll and tear

369

(2)

R Superfine

M Falvo

J Steele

G Matthews

M Guthold

D Erie

A Helser

M G Jones

R M Taylor II

S Washburn

Atomic force mapping and control of atomic force on a Si(111) 3x3-Ag surface using a noncontact atomic force microscope

371

(2)

S Morita

Y Sugawara

Painful but rewarding application of C-V and I-V measurements to the nanoscale using SPM

373

(2)

A Erickson

P De Wolf

E Brazel

M Lefevre

Ultrahigh vacuum scanning electron/tunneling combined microscope system

375

(2)

Y Homma

P Finnie

T Ogino

Failure analysis with scanning probe microscopes

377

(2)

K F Jarausch

R J Kline

J F Richards

A challenge to atom-by-atom chemical analysis on solid surfaces by scanning probe technique

379

(2)

T Shimizu

H Tokumoto

STM light emission from Ag deposited surfaces on Si(111)

381

(2)

N Yamamoto

S Kagami

H Minoda

Mechanism of atomic scale variations in contact potential difference on Au/Si (111) surface by UHV SKPM

383

(2)

S Kitamura

K Suzuki

M Iwatsuki

C B Mooney

Atomic structure and growth of the Cu/Si(111) ``5 x 5'' phase

385

(2)

T Kawasaki

T An

H Ito

T Ichinokawa

Effects of humidity on biological fibres measured using the scanning probe microscope

387

(2)

J M Maxwell

M G Huson

X J Dai

Environmental atomic force microscopy: probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures

389

(2)

D N Leonard

R J Spontak

P E Russell

Investigation and modeling of electric field gradients by electric force microscopy (EFM)

391

(2)

G J Thorogood

K T Short

M Stevens Kalceff

Symposium 13: Standardization for microbeam analysis

Reference materials for microprobe analysis of carbon and nitrogen

393

(2)

S R J Saunders

P Karduck

W G Sloof

M Whitwood

P Busch

J Almagro

J-F Thiot

T Wirth

H Schneider

New needs for imaging and X-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis

395

(2)

B J Griffin

C E Nocklods

M R Phillips

G Remond

Activities of the international organization for standardization technical committee 202 microbeam analysis

397

(2)

J A Small

ASTM standards in microscopy and microanalysis

399

(2)

J J Friel

Characterization of Corning standard glasses 95IRV, 95IRW, and 95IRX, by ICP-AES, XRF, and EPMA

401

(2)

P Carpenter

D Counce

E Kluk

C Nabelek

The development of an ASTM standard for automated inclusion analysis in steels using SEM/EDS methodology

403

(2)

N C Barbi

Status of microanalysis standards at the National Institute of Standards and Technology (NIST)

405

(2)

R B Marinenko

Reference materials for microbeam analysis---developments in Europe

407

(2)

U Watjen

The institution and application of standard sample referential document of sedimentary mineral

409

(2)

B Shujing

C Wenxue

Z Jianwen

W Shenwen

Symposium 14: Quantitative X-ray microanalysis of bulk specimens

Microanalysis, mapping and soft X-ray spectroscopy---inseparable companions in microcharacterisation

411

(2)

I R Harrowfield

C M MacRae

H Takahashi

N Wilson

Irregular effects in X-ray spectra of Mg-Se compounds

413

(2)

M Zelechower

Use of spectrum simulation to predict detection limits and improve confidence in X-ray analysis

415

(2)

P Statham

Setting up quantitative WDS EPMA analysis: a new `on line' assistance tool

417

(2)

P-F Staub

C Fournier

C Merlet

Thin film thickness semi-empirical measurement by EPMA

419

(2)

H Qin

Y Yang

C Lu

Depth profile analysis in the sub-micron range by sputter-assisted EPMA

421

(2)

S Richter

P Karduck

Quantitative EPMA of ultra-light elements: strategies and pitfalls

423

(2)

G F Bastin

H J M Heijligers

Analysis of boron by EPMA: correction for dual Mo and Si interferences for phases in the Mo-B-Si system

425

(2)

J H Fournelle

J J Donovan

S Kim

J H Perepezko

Quantitative electron probe microanalysis of rough, bulk samples

427

(2)

D E Newbury

Optimal methods for the quantitative analysis of individual microparticles and irregular surfaces

429

(2)

J T Armstrong

Averaging of electron backscatter and X-ray continuum intensities in multi-element compounds

431

(2)

J J Donovan

A Westphal

An evaluation of the accuracy of EPMA measurements in the system HgTe-CdTe

433

(2)

P Carpenter

Novel methods to the mapping analysis and the spectroscopy in electron probe X-ray microanalysis (EPMA) using digital techniques

435

(2)

H Takahashi

Spectrum imaging: the future of quantitative X-ray mapping?

437

(2)

I M Anderson

Electron microprobe age mapping and dating of monazite: techniques and applications

439

(2)

M J Jercinovic

M L Williams

X-ray maps acquisition of mineral forming elements performed by electron probe microanalysis

441

(2)

R Cossio

A Borghi

F Olmi

G Vaggelli

Quantitative X-ray mapping in wavelength dispersive electron probe microanalysis

443

(2)

S Bremier

M Mostert

C T Walker

Applications of EPMA to solid materials

445

(2)

J I Goldstein

Ni-solute redistribution for the δ/γ competitive growth of the directionally solidifying Fe-Ni alloys

447

(2)

T Okane

A Dytkowicz

J Kloch

T Umeda

W Wolczynski

SEM/EDS, AFM and XRD analysis of ternary nitride coatings produced by magnetron co-sputtering at different nitrogen pressures

449

(2)

R Wuhrer

W Yeung

M R Phillips

Microanalysis of early-medieval glass gems found in the Bohemian and Moravian region

451

(2)

V Hulinsky

O Gedeon

E Cerna

Comparison between major and trace element concentrations in rock-forming minerals performed by EPMA and microPIXE techniques

453

(2)

A Borghi

R Cossio

G Della Mea

C Mazzoli

R Ruffini

Quantitative modal analysis of meteorite thin sections: image processing of X-ray element maps

455

(2)

T L Hicks

T J Fagan

C S Todd

K Keil

Sn/Bi solder element map comparisons between a superprobe and a standard SEM EDS system

457

(2)

W J D Shaw

M A Fraser

Microanalysis and microtextures of Hawaiian pahoehoe lavas

459

(2)

J S Lowther

K A Brunstad

Microbeam analysis of lava from the current Kilauea eruption: an integral part of volcano monitoring

461

(2)

C R Thornber

G P Meeker

Extended X-ray emission fine structure (EXEFS) of EPMA

463

(2)

J Kawai

Symposium 15: General applications, techniques and instrumentation

Property nanomeasurements of individual nanostructures by in-situ TEM

465

(2)

Z L Wang

R P Gao

Z G Bai

P Poncharal

W A de Heer

Gradient concentration profile of high energy IBAD SiNx thin film measured by RBS method and comparison with mathematical model

467

(2)

F Cerny

S Konvickova

V Hnatowicz

Identification of unknown single phases with composition data by weight-% using the modified PDF-2™ and NIST-crystal-data™ file

469

(2)

A R Hoelzel

New findings in analysis of alkali silicate glass in electron beam techniques

471

(2)

O Gedeon

V Hulinsky

K Jurek

Evaluating the stability of BN interfacial coatings in SiC/SiC composites exposed to oxygen- and H2O-containing environments

473

(2)

K L More

P F Tortorelli

L R Walker

Study on the fractal characterization of 30CrMnSi fractured surfaces

475

(2)

S Zhou

A novel CCD video camera with operation-function incorporated

477

(2)

K Nishikata

Y Kimura

Y Takai

R Shimizu

T Ikuta

Modeling of electron beam deflection from charging in electron beam lithography

479

(2)

J J Hwu

Y Ko

D C Joy

Field emission spectra from a superconducting Nb tip

481

(2)

K Matsuda

H Fujii

M Komaki

Y Murata

K Nagaoka

C Oshima

A floating type compact low energy ion gun for nm-etching

483

(2)

T Matsutani

Y W Beag

Y Takai

R Shimizu

R Aihara

Y Sakuma

Visualization of electric potential distribution by amplitude-division three-wave interference

485

(2)

T Hirayama

K Miyashita

Optimized weighting problem in the defocus image modulation processing

487

(2)

T Ikuta

Structure and characteristic of amorphous carbon films prepared by pulse laser deposition

489

(2)

P R Zhu

S B Wang

Z J Zhang

Author Index

491

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Microbeam Analysis: Proceedings of the International Conference on Microbeam Analysis, 8-15 July, 2000

Summary

Table of Contents

Supplemental Materials