Microelectronic Processing Inorganic Materials Characterization

Note: Supplemental materials are not guaranteed with Rental or Used book purchases.

ISBN: 9780841209343 | 0841209340
Cover: Hardcover
Copyright: 1/15/1986

Rent

(Recommended)

$77.89

Term

Due

Price

Semester

Dec 12

$81.99

Quarter

Aug 13

$77.89

Short Term

Jul 11

$73.79

*This item is part of an exclusive publisher rental program and requires an additional convenience fee. This fee will be reflected in the shopping cart.
Buy New

Usually Ships in 3-5 Business Days

$104.96

Examines leading-edge developments in the field of materials development. Covers all major aspects of materials science, with applications to many high technology areas. Explores the role of chemistry in high-tech materials and their applications.

Please wait while the item is added to your bag...

Analytical Approaches and Expert Systems in the Characterization of Microelectronic
Devices Electrical Characterization of Semiconductor
Materials and Devices Dopant Profiles by the Spreading Resistance Technique
SEM Techniques for Characterization of Semiconductor Materials
Semiconductor Materials Defect Diagnostics for Submicron VLSI
Technology Applications of Secondary Ion Mass Spectroscopy to Characterization of Microelectronic
Materials Applications of Auger Electron Spectroscopy in Microelectronics
X-Ray Photoelectron Spectroscopy Applied to Microelectronic Materials
Application of Neutron Depth Profiling to Microelectronic Materials
Processing Thermal-Wave Measurement of Thin Film
Thickness Characterization of Materials, Thin Films, and Interfaces by Optical Reflectance and Ellipsometric Techniques
Measurement of the Oxygen and Carbon
Content of Silicon Wafers by Fourier Transform
Spectrophotometry Application of the Raman Microprobe to Analytical Problems of Microelectronics
Characterization of GaAs by Magneto-Optical Photoluminescent Spectroscopy
Thermal-Wave Imaging in a Scanning Electron Microscope Fourier
Transform Mass Spectrometry in the Microelectronics
Service Laboratory Materials Characterization
Using Elemental and Isotope Analysis by Inductively
Coupled Plasma Mass Spectrometry (ICP-MS)
Activation Analysis of Electronics Materials
Trace Element Survey Analyses by Spark Source Mass Spectrography (SSMS)
Characterization of Components in Plasma Phosphorus
Doped Oxides Process Control of Vacuum-Deposited
Nickel-Chromium for the Fabrication of Reproducible
Thin Film Resistors Characterization of Spin-On Glass
Films as a Planarizing Dielectric Effects of Various
Chemistries on Silicon Wafer Cleaning
Monitoring of Particles in Gases
Using a Laser Counter Microelectronics Processing Problem Solving
The Synergism of Complementary Techniques
Table of Contents provided by Publisher. All Rights Reserved.

FREE SHIPPING

Rent More, Save More! Use code: BBRENTAL

5% off 1 book, 7% off 2 books, 10% off 3+ books

Microelectronic Processing Inorganic Materials Characterization

Summary

Table of Contents

Supplemental Materials

FREE SHIPPING

Rent More, Save More! Use code: BBRENTAL

5% off 1 book, 7% off 2 books, 10% off 3+ books

Microelectronic Processing Inorganic Materials Characterization

Summary

Table of Contents

Supplemental Materials

Digital License