Portable X-ray Fluorescence Spectrometry

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ISBN: 9780854045525 | 085404552X
Cover: Hardcover
Copyright: 9/1/2008

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Portable X-ray fluorescence (PXRF) instrumentation has some unique analytical capabilities for the in situ analysis of samples in the field. In this monograph, an overview is given of instrumentation, analytical capabilities, and limitations in the interpretation of results, sampling considerations and applications where PXRF offers substantial advantages over conventional analytical techniques. The aim is to give the reader an insight into the capabilities of the technique and to demonstrate the contribution it can make to different contemporary areas of scientific interest.

Introduction, Analytical Instrumentation and Application Overview
Portable X-ray Fluorescence	p. 1
Techniques Capable of In Situ Portable Analytical Measurements	p. 2
Spark Source Optical Emission Spectrometry	p. 2
Gamma Spectrometry	p. 2
Chemical Test Kits	p. 4
Laser-Induced Breakdown Spectroscopy (LIBS)	p. 4
Portable X-ray Fluorescence	p. 4
PXRF Instrumentation	p. 5
Excitation Sources	p. 5
Sampling Positioning	p. 7
Detectors	p. 8
Pulse Processing and Data Analysis	p. 9
Modes of Operation	p. 10
Applications	p. 11
Interactive Sampling and Analysis	p. 11
Judgemental Sampling and Analysis	p. 11
Conventional Sampling and Analysis Not Possible	p. 12
Reference	p. 12
Quantification and Correction Procedures
Overview	p. 13
Introduction	p. 13
Types of X-ray Fluorescence Technique	p. 15
Scattering of Primary Radiation	p. 16
General Considerations	p. 17
Critical Penetration Depth	p. 18
Analytical Parameters of XRF Analysis	p. 18
Total Uncertainty of In Situ XRF Measurements	p. 20
Factors Influencing Accuracy	p. 21
Physical Matrix Effects	p. 21
Chemical Matrix Effects	p. 24
Spectral Interferences	p. 24
Correction Procedures for Physical Matrix Effects	p. 25
Correction for Surface Irregularity Effects	p. 25
Correction for Mineralogy Effects	p. 26
Correction Procedures for Chemical Matrix Effects	p. 27
Analysis of Thin Samples	p. 28
Analysis of Intermediate Thickness Samples	p. 28
Analysis of Thick Samples	p. 30
Other Methods Applied for the Chemical Matrix Effects Correction	p. 35
References	p. 36
Contaminated Land: Cost-effective Investigation within Sampling Constraints
Introduction	p. 39
Typical In Situ Applications of PXRF	p. 40
Advantages and Disadvantages of In Situ PXRF	p. 41
Uncertainty in PXRF Measurements	p. 44
Factors Controlling the Precision, and hence Detection Limits	p. 50
Less Obvious Advantages and Disadvantages of In Situ PXRF	p. 52
Future Developments	p. 53
References	p. 54
Coatings, Paint and Thin Film Deposits
Introduction	p. 56
What is a Coating?	p. 56
Brief Overview of Major Non-destructive Methods of Coating Thickness Measurement	p. 57
XRF Method for Coating Thickness	p. 60
Theory	p. 60
Selection of Optimum Analytical Conditions	p. 64
Coating Range and Excitation Source	p. 66
Sensitivity and Precision of Measurement	p. 66
Typical Examples	p. 68
Special Cases of Coating Measurements	p. 71
Lead in Applied Paint	p. 71
Air Particulates on Filter	p. 73
Summary and Conclusions	p. 79
References	p. 80
Hazardous Substances in the Workplace
Introduction to Occupational Hygiene	p. 83
Routes for Exposure	p. 84
Inhalation	p. 84
Dermal Exposure	p. 85
Oral Exposure	p. 85
Sampling	p. 85
Air	p. 86
Dermal Contamination	p. 89
Contaminated Surfaces	p. 89
Theoretical Considerations	p. 90
Specimen Layer Depth	p. 90
Particle Size	p. 92
Background Blanks	p. 92
Measurements in the Workplace	p. 93
Air Monitoring	p. 93
Contaminated Surfaces	p. 95
Conclusion	p. 96
References	p. 96
Alloy Identification and Analysis with a Field-Portable XRF Analyser
Introduction	p. 98
Rationale behind Analysis of Alloys in the Field	p. 98
Existing Methods of Alloys Identification and XRF Analysis	p. 101
Addressing the Problem of Alloy Identification	p. 102
Defining the Task	p. 102
Solutions	p. 103
Analytical Approach	p. 106
Quantitative Assaying Schemes used in XRF Analysis of Alloys	p. 108
Qualitative Identification and Sorting of Alloys	p. 114
Pass/Fail Sorting	p. 116
Type Calibration	p. 116
Modern, Field-Portable XRF Analyser for Alloys	p. 117
Hardware Considerations	p. 117
Software	p. 118
Commercially Available Instruments - Feature Comparison	p. 121
Typical Performance Data	p. 122
Practical Issues to Consider	p. 132
Radioisotope or X-ray Tube Excitation?	p. 132
Sample Condition	p. 136
Summary and Conclusions	p. 138
Acknowledgements	p. 138
References	p. 138
Geochemical Prospecting
Introduction	p. 141
In Situ PXRF Analysis	p. 142
Natural Soil	p. 142
Natural Rock	p. 148
Drill Core and Borehole Logging	p. 152
Sediments	p. 155
Prepared Soil and Rock Samples	p. 157
Applications in Mining	p. 159
Applications in Mineral Processing	p. 166
References	p. 172
The Application of Portable X-Ray Fluorescence Analysis to Archaeological Lithic Provenancing
Introduction	p. 174
Background and Early Applications of PXRF in Archaeology	p. 175
Instrumental, Practical and Analytical Considerations in Field and Museum Applications of PXRF	p. 176
Instrumentation and its Suitability for Silicate Lithic Analysis	p. 176
Practical and Analytical Considerations Important for Field and Museum Applications of PXRF	p. 177
Applications	p. 182
British Neolithic and Bronze Age Stone Axes	p. 182
Roman Imperial Porphyry	p. 192
Roman Granite Columns	p. 194
Assessment of the Contribution of PXRF to Lithic Provenancing, and Comment on its Future Potential	p. 200
Acknowledgements	p. 203
References	p. 203
Portable Systems for Energy-Dispersive X-Ray Fluorescence Analysis of Works of Art
Introduction	p. 206
Theoretical Background	p. 207
Thick Samples	p. 207
Thin Samples	p. 209
Thickness Measurement in the Case of Thin Layers	p. 210
Objects, their Preparation and Elements that can be Analysed	p. 213
Instrumentation for PXRF Analysis	p. 216
Radiation Sources	p. 216
X-ray Detectors	p. 217
Multi-channel Analyser	p. 218
Capillary Collimators	p. 218
Experimental Set-Up	p. 219
Results	p. 219
Bronze Statues	p. 219
Mural Paintings	p. 229
Gold Artefacts	p. 231
Paintings	p. 235
Conclusions	p. 243
Acknowledgements	p. 243
References	p. 243
Extraterrestrial Analysis: Planetary X-Ray Fluorescence from Orbiting Spacecraft and Landers
Introduction	p. 247
In Situ XRF Analysis of Planetary Surfaces	p. 248
Instrumentation Principles	p. 248
Missions	p. 251
Future Developments	p. 256
X-Ray Remote Sensing of Planetary Surfaces	p. 257
Sources of Primary Excitation	p. 258
Non-imaging and Imaging Instruments	p. 261
Missions	p. 265
Acknowledgements	p. 274
References	p. 274
Table of Contents provided by Ingram. All Rights Reserved.

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