Scanning Force Microscopy With Applications

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Preface to the Revised Edition	p. vii
Preface	p. ix
Levers and Noise
Mechanical Properties of Levers	p. 1
Introduction	p. 1
Stress and Strain	p. 2
Moments	p. 4
Spring Constant	p. 5
The Rayleigh Solution to a Vibrating Lever	p. 7
The Classical Solution to a Vibrating Lever	p. 9
Normal Modes	p. 10
Lumped Systems	p. 12
Examples	p. 13
Summary	p. 17
Resonance Enhancement	p. 19
Introduction	p. 19
Bimorph Driver	p. 19
Effective Spring Constant	p. 21
Bimorph-Driven Lever	p. 22
Sample-Driven Lever	p. 32
Tip-Driven Lever	p. 35
Summary	p. 37
Sources of Noise	p. 39
Introduction	p. 39
General Discussion of Noise	p. 39
Shot Noise	p. 41
Resistor Johnson Noise	p. 42
Laser Intensity Noise	p. 42
Laser Phase Noise	p. 43
Thermally Induced Lever Noise	p. 46
Bimorph Noise	p. 49
Lever Noise-Limited SNR	p. 49
Experimental Characterization of Noise	p. 50
Summary	p. 53
Scanning Force Microscopes
Tunneling Detection System	p. 55
Introduction	p. 55
Theory	p. 55
Perpendicular Arrangement	p. 57
Cross Arrangement	p. 64
Parallel Arrangement	p. 64
Serial Arrangement	p. 64
Single-Lever Arrangement	p. 64
Summary	p. 64
Capacitance Detection System	p. 65
Introduction	p. 65
Theory	p. 66
Noise Considerations	p. 68
Performance of Systems	p. 69
Summary	p. 73
Homodyne Detection System	p. 75
Introduction	p. 75
Theory	p. 76
Noise Considerations	p. 81
System Performance	p. 84
Summary	p. 89
Heterodyne Detection System	p. 91
Introduction	p. 91
Theory	p. 92
Noise Considerations	p. 95
Performance	p. 96
Summary	p. 99
Laser-Diode Feedback Detection System	p. 101
Introduction	p. 101
Theory	p. 102
Noise Considerations	p. 105
Performance	p. 107
Summary	p. 108
Polarization Detection System	p. 109
Introduction	p. 109
Theory	p. 109
Noise Considerations	p. 113
Performance	p. 116
Summary	p. 117
Deflection Detection System	p. 119
Introduction	p. 119
Theory	p. 120
Noise Considerations	p. 122
Performance	p. 125
Summary	p. 128
Scanning Force Microscopy
Electric Force Microscopy	p. 129
Introduction	p. 129
Basic Concepts	p. 129
Examples	p. 131
Principles of Operation	p. 137
Noise Considerations	p. 145
Applications	p. 146
Performance	p. 148
Summary	p. 151
Magnetic Force Microscopy	p. 153
Introduction	p. 153
Basic Concepts	p. 153
Examples	p. 156
Principles of Operation	p. 167
Noise Considerations	p. 173
Applications	p. 174
Performance	p. 174
Summary	p. 180
Atomic Force Microscopy	p. 181
Introduction	p. 181
Intermolecular Microscopic Interactions	p. 182
Intermolecular Macroscopic Interactions	p. 189
Lever-Tip-Sample Contact Interactions	p. 197
Lever-Tip-Sample Noncontact Interactions	p. 210
Experimental Results for the Contact Mode	p. 218
References	p. 233
Index	p. 261
Table of Contents provided by Syndetics. All Rights Reserved.

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Scanning Force Microscopy With Applications to Electric, Magnetic, and Atomic Forces

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