Semiconductor Memories Technology, Testing, and Reliability

Note: Supplemental materials are not guaranteed with Rental or Used book purchases.

ISBN: 9780780310001 | 0780310004
Cover: Hardcover
Copyright: 9/10/2002

Buy Used

Usually Ships in 2-4 Business Days

$188.12
Buy New

Print on Demand: 2-4 Weeks. This item cannot be cancelled or returned.

$253.10

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.

Preface

Introduction

(9)

Random Access Memory Technologies

(71)

Introduction

(2)

Static Random Access Memories (SRAMs)

(28)

SRAM (NMOS and CMOS) Cell Structures

(2)

MOS SRAM Architectures

(1)

MOS SRAM Cell and Peripheral Circuit Operation

(2)

Bipolar SRAM Technologies

(1)

Direct-Coupled Transistor Logic (DCTL) Technology

(1)

Emitter-Coupled Logic (ECL) Technology

(1)

BiCMOS Technology

(4)

Silicon-on-Insulator (SOI) Technology

(4)

Advanced SRAM Architectures and Technologies

(1)

1--4 Mb SRAM Designs

(4)

16--64 Mb SRAM Development

(2)

Gallium Arsenide (GaAs) SRAMs

(1)

Application-Specific SRAMs

(1)

Serially Accessed Memory (Line Buffers)

(1)

Dual-Port RAMs

(2)

Nonvolatile SRAMs

(1)

Content-Addressable Memories (CAMs)

(2)

Dynamic Random Access Memories (DRAMs)

(41)

DRAM Technology Development

(5)

CMOS DRAMs

(2)

1 Mb DRAM (Example)

(3)

DRAM Cell Theory and Advanced Cell Structures

(2)

Trench Capacitor Cells

(3)

Stacked Capacitor Cells (STC)

(3)

BiCMOS DRAMs

(2)

Soft-Error Failures in DRAMs

(2)

Advanced DRAM Designs and Architectures

(1)

A 16 Mb DRAM (Example)

(1)

ULSI DRAM Developments

(5)

Application-Specific DRAMs

(1)

Pseudostatic DRAMs (PSRAMs)

(1)

Silicon File

(1)

Video DRAMs (VRAMs)

(1)

High-Speed DRAMs

(4)

Application-Specific RAM Glossary and Summary of Important Characteristics

(6)

Nonvolatile Memories

(59)

Introduction

(2)

Masked Read-Only Memories (ROMs)

(4)

Technology Development and Cell Programming

(2)

ROM Cell Structures

(2)

High-Density (Multimegabit) ROMs

(1)

Programmable Read-Only Memories (PROMs)

(6)

Bipolar PROMs

(4)

CMOS PROMs

(2)

Erasable (UV)-Programmable Read-Only Memories (EPROMs)

(11)

Floating-Gate EPROM Cell

(3)

EPROM Technology Developments

(1)

1 Mb EPROM (Example)

(1)

Advanced EPROM Architectures

(5)

One-Time Programmable (OTP) EPROMs

103

(1)

Electrically Erasable PROMs (EEPROMs)

104

(18)

EEPROM Technologies

105

(1)

Metal--Nitride--Oxide Silicon (MNOS) Memories

105

(4)

Silicon--Oxide Nitride--Oxide Semiconductor (SONOS) Memories

109

(1)

Floating-Gate Tunneling Oxide (FLOTOX) Technology

110

(5)

Textured-Polysilicon Technology

115

(1)

EEPROM Architectures

116

(4)

Nonvolatile SRAM (or Shadow RAM)

120

(2)

Flash Memories (EPROMs or EEPROMs)

122

(18)

Flash Memory Cells and Technology Developments

123

(5)

Advanced Flash Memory Architectures

128

(12)

Memory Fault Modeling and Testing

140

(55)

Introduction

140

(2)

RAM Fault Modeling

142

(16)

Stuck-At Fault Model

142

(3)

Bridging Faults

145

(2)

Coupling Faults

147

(4)

Pattern-Sensitive Faults

151

(4)

Miscellaneous Faults

155

(1)

GaAs SRAM Fault Modeling and Testing

155

(1)

Embedded DRAM Fault Modeling and Testing

156

(2)

RAM Electrical Testing

158

(18)

DC and AC Parametric Testing

158

(1)

Functional Testing and some Commonly Used Algorithms

158

(16)

Functional Test Pattern Selection

174

(2)

RAM Pseudorandom Testing

176

(2)

Megabit DRAM Testing

178

(2)

Nonvolatile Memory Modeling and Testing

180

(5)

DC Electrical Measurements

181

(1)

AC (Dynamic) and Functional Measurements

182

(1)

256K UVEPROM

182

(1)

64K EEPROM

183

(2)

IDDQ Fault Modeling and Testing

185

(4)

Application Specific Memory Testing

189

(6)

General Testing Requirements

189

(2)

Double-Buffered Memory (DBM) Testing

191

(4)

Memory Design for Testability and Fault Tolerance

195

(54)

General Design for Testability Techniques

195

(8)

Ad Hoc Design Techniques

196

(1)

Logic Partitioning

196

(1)

Input/Output Test Points

196

(1)

Structured Design Techniques

197

(1)

Level-Sensitive Scan Design

197

(2)

Scan Path

199

(1)

Scan/Set Logic

199

(1)

Random Access Scan

200

(2)

Boundary Scan Testing

202

(1)

RAM Built-In Self-Test (BIST)

203

(8)

BIST Using Algorithmic Test Sequence

205

(2)

BIST Using 13N March Algorithm

207

(2)

BIST for Pattern-Sensitive Faults

209

(1)

BIST Using Built-In Logic Block Observation (BILBO)

210

(1)

Embedded Memory DFT and BIST Techniques

211

(5)

Advanced BIST and Built-In Self-Repair Architectures

216

(12)

Multibit and Line Mode Tests

216

(3)

Column Address-Maskable Parallel Test (CMT) Architecture

219

(1)

BIST Scheme Using Microprogram ROM

220

(2)

BIST and Built-In Self-Repair (BISR) Techniques

222

(6)

DFT and BIST for ROMs

228

(2)

Memory Error-Detection and Correction Techniques

230

(11)

Memory Fault-Tolerance Designs

241

(8)

Semiconductor Memory Reliability

249

(71)

General Reliability Issues

249

(9)

Semiconductor Bulk Failures

252

(1)

Dielectric-Related Failures

252

(1)

Semiconductor--Dielectric Interface Failures

253

(2)

Conductor and Metallization Failures

255

(1)

Metallization Corrosion-Related Failures

256

(1)

Assembly-and Packaging-Related Failures

257

(1)

RAM Failure Modes and Mechanisms

258

(10)

RAM Gate Oxide Reliability

258

(2)

RAM Hot-Carrier Degradation

260

(2)

DRAM Capacitor Reliability

262

(1)

Trench Capacitors

262

(2)

Stacked Capacitors

264

(1)

DRAM Soft-Error Failures

264

(3)

DRAM Data-Retention Properties

267

(1)

Nonvolatile Memory Reliability

268

(19)

Programmable Read-Only Memory (PROM) Fusible Links

268

(2)

EPROM Data Retention and Charge Loss

270

(5)

Electrically Erasable Programmable Read-Only Memories (EEPROMs)

275

(5)

Flash Memories

280

(3)

Ferroelectric Memories

283

(4)

Reliability Modeling and Failure Rate Prediction

287

(9)

Reliability Definitions and Statistical Distributions

287

(2)

Binomial Distribution

289

(1)

Poisson Distribution

289

(1)

Normal (or Gaussian) Distribution

289

(2)

Exponential Distribution

291

(1)

Gamma Distribution

291

(1)

Weibull Distribution

291

(1)

Lognormal Distribution

292

(1)

Reliability Modeling and Failure Rate Prediction

292

(4)

Design for Reliability

296

(4)

Reliability Test Structures

300

(4)

Reliability Screening and Qualification

304

(16)

Reliability Testing

304

(6)

Screening, Qualification, and Quality Conformance Inspections (QCI)

310

(10)

Semiconductor Memory Radiation Effects

320

(67)

Introduction

320

(2)

Radiation Effects

322

(25)

Space Radiation Environments

322

(3)

Total Dose Effects

325

(5)

Single-Event Phenomenon (SEP)

330

(3)

DRAM and SRAM Upsets

333

(2)

SEU Modeling and Error Rate Prediction

335

(2)

SEP In-Orbit Flight Data

337

(7)

Nonvolatile Memory Radiation Characteristics

344

(3)

Radiation-Hardening Techniques

347

(20)

Radiation-Hardening Process Issues

347

(1)

Substrate Effects

347

(1)

Gate Oxide (Dielectric) Effects

347

(1)

Gate Electrode Effects

348

(1)

Postgate-Electrode Deposition Processing

349

(1)

Field Oxide Hardening

349

(1)

Bulk CMOS Latchup Considerations

350

(1)

CMOS SOS/SOI Processes

351

(1)

Bipolar Process Radiation Characteristics

352

(1)

Radiation-Hardening Design Issues

352

(1)

Total Dose Radiation Hardness

353

(5)

Single-Event Upset (SEU) Hardening

358

(5)

Radiation-Hardened Memory Characteristics (Example)

363

(4)

Radiation Hardness Assurance and Testing

367

(20)

Radiation Hardness Assurance

367

(2)

Radiation Testing

369

(1)

Total Dose Testing

370

(2)

Single-Event Phenomenon (SEP) Testing

372

(4)

Dose Rate Transient Effects

376

(1)

Neutron Irradiation

377

(1)

Radiation Dosimetry

377

(1)

Wafer Level Radiation Testing and Test Structures

378

(1)

Wafer Level Radiation Testing

378

(1)

Radiation Test Structures

379

(8)

Advanced Memory Technologies

387

(25)

Introduction

387

(2)

Ferroelectric Random Access Memories (FRAMs)

389

(8)

Basic Theory

389

(1)

FRAM Cell and Memory Operation

390

(3)

FRAM Technology Developments

393

(1)

FRAM Reliability Issues

393

(2)

FRAM Radiation Effects

395

(2)

FRAMs Versus EEPROMs

397

(1)

Gallium Arsenide (GaAs) FRAMs

397

(1)

Analog Memories

398

(3)

Magnetoresistive Random Access Memories (MRAMs)

401

(6)

Experimental Memory Devices

407

(5)

Quantum--Mechanical Switch Memories

407

(1)

A GaAs n-p-n-p Thyristor/JFET Memory Cell

408

(1)

Single-Electron Memory

409

(1)

Neuron-MOS Multiple-Valued (MV) Memory Technology

409

(3)

High-Density Memory Packaging Technologies

412

(39)

Introduction

412

(5)

Memory Hybrids and MCMs (2-D)

417

(7)

Memory Modules (Commercial)

417

(4)

Memory MCMs (Honeywell ASCM)

421

(1)

VLSI Chip-on-Silicon (VCOS) Technology

421

(3)

Memory Stacks and MCMs (3-D)

424

(11)

3-D Memory Stacks (Irvine Sensors Corporation)

427

(2)

4 Mb SRAM Short Stack (TM) (Example)

429

(1)

3-D Memory Cube Technology (Thomson CSF)

430

(1)

3-D Memory MCMs (GE-HDI/TI)

431

(1)

3-D HDI Solid-State Recorder (Example)

432

(1)

3-D Memory Stacks (n CHIPS)

432

(3)

Memory MCM Testing and Reliability Issues

435

(5)

VCOS DFT Methodology and Screening Flow (Example)

437

(3)

Memory Cards

440

(6)

CMO SRAM Card (Example)

442

(1)

Flash Memory Cards

442

(4)

High-Density Memory Packaging Future Directions

446

(5)

Index

451

Please wait while the item is added to your bag...

FREE SHIPPING

Amazon no longer offers textbook rentals. We do!

Semiconductor Memories Technology, Testing, and Reliability

Summary

Author Biography

Table of Contents

Supplemental Materials