Spectroscopic Ellipsometry Principles and Applications
, by Fujiwara, HiroyukiNote: Supplemental materials are not guaranteed with Rental or Used book purchases.
- ISBN: 9780470016084 | 0470016086
- Cover: Hardcover
- Copyright: 3/12/2007
Spectroscopic ellipsometry has established its position as a high-precision optical-characterization technique - nevertheless, the principles of ellipsometry are often said to be difficult to understand, so the objective of this highly-illustrated book is to provide a fundamental insight into the technique by providing general descriptions for measurement and data analysis methods employed widely in spectroscopic ellipsometry.
Dr Hiroyuki Fujiwara is based at the National Institute of Advanced Industrial Science and Technology, Ibaraki, Japan. He received his PhD at the Tokyo Institute of Technology in 1996 and carried out post-doctoral research with Professor R.W. Collins at Penn State University. From 1998 to present he has been working as a senior research scientist at the Research Center for Photovoltaics at NIAIST. He received the 'Most Promising Young Scientist Award' from the Japan Society of Applied Physics and the 'Young Researcher Award' at the World Conference on Photovoltaic Energy Conversion in 2003.
Foreword | p. xiii |
Preface | p. xv |
Acknowledgments | p. xvii |
Introduction to Spectroscopic Ellipsometry | p. 1 |
Features of Spectroscopic Ellipsometry | p. 1 |
Applications of Spectroscopic Ellipsometry | p. 3 |
Data Analysis | p. 5 |
History of Development | p. 7 |
Future Prospects | p. 9 |
References | p. 10 |
Principles of Optics | p. 13 |
Propagation of Light | p. 13 |
Propagation of One-Dimensional Waves | p. 13 |
Electromagnetic Waves | p. 18 |
Refractive Index | p. 19 |
Dielectrics | p. 24 |
Dielectric Polarization | p. 24 |
Dielectric Constant | p. 25 |
Dielectric Function | p. 29 |
Reflection and Transmission of Light | p. 32 |
Refraction of Light | p. 32 |
p- and s-Polarized Light Waves | p. 33 |
Reflectance and Transmittance | p. 39 |
Brewster Angle | p. 40 |
Total Reflection | p. 42 |
Optical Interference | p. 43 |
Optical Interference in Thin Films | p. 43 |
Multilayers | p. 46 |
References | p. 48 |
Polarization of Light | p. 49 |
Representation of Polarized Light | p. 49 |
Phase of Light | p. 49 |
Polarization States of Light Waves | p. 50 |
Optical Elements | p. 52 |
Polarizer (Analyzer) | p. 53 |
Compensator (Retarder) | p. 57 |
Photoelastic Modulator | p. 58 |
Depolarizer | p. 59 |
Jones Matrix | p. 60 |
Jones Vector | p. 60 |
Transformation of Coordinate Systems | p. 62 |
Jones Matrices of Optical Elements | p. 66 |
Representation of Optical Measurement | p. 68 |
Stokes Parameters | p. 70 |
Definition of Stokes Parameters | p. 70 |
Poincare Sphere | p. 72 |
Partially Polarized Light | p. 75 |
Mueller Matrix | p. 77 |
References | p. 78 |
Principles of Spectroscopic Ellipsometry | p. 81 |
Principles of Ellipsometry Measurement | p. 81 |
Measured Values in Ellipsometry | p. 81 |
Coordinate System in Ellipsometry | p. 84 |
Jones and Mueller Matrices of Samples | p. 86 |
Ellipsometry Measurement | p. 87 |
Measurement Methods of Ellipsometry | p. 87 |
Rotating-Analyzer Ellipsometry (RAE) | p. 93 |
Rotating-Analyzer Ellipsometry with Compensator | p. 97 |
Rotating-Compensator Ellipsometry (RCE) | p. 99 |
Phase-Modulation Ellipsometry (PME) | p. 104 |
Infrared Spectroscopic Ellipsometry | p. 106 |
Mueller Matrix Ellipsometry | p. 111 |
Null Ellipsometry and Imaging Ellipsometry | p. 113 |
Instrumentation for Ellipsometry | p. 117 |
Installation of Ellipsometry System | p. 117 |
Fourier Analysis | p. 120 |
Calibration of Optical Elements | p. 122 |
Correction of Measurement Errors | p. 127 |
Precision and Error of Measurement | p. 130 |
Variation of Precision and Error with Measurement Method | p. 131 |
Precision of ([psi], [Delta]) | p. 135 |
Precision of Film Thickness and Absorption Coefficient | p. 137 |
Depolarization Effect of Samples | p. 139 |
References | p. 141 |
Data Analysis | p. 147 |
Interpretation of ([psi], [Delta]) | p. 147 |
Variations of ([psi], [Delta]) with Optical Constants | p. 147 |
Variations of ([psi], [Delta]) in Transparent Films | p. 150 |
Variations of ([psi], [Delta]) in Absorbing Films | p. 155 |
Dielectric Function Models | p. 158 |
Lorentz Model | p. 160 |
Interpretation of the Lorentz Model | p. 162 |
Sellmeier and Cauchy Models | p. 170 |
Tauc-Lorentz Model | p. 170 |
Drude Model | p. 173 |
Kramers-Kronig Relations | p. 176 |
Effective Medium Approximation | p. 177 |
Effective Medium Theories | p. 177 |
Modeling of Surface Roughness | p. 181 |
Limitations of Effective Medium Theories | p. 184 |
Optical Models | p. 187 |
Construction of Optical Models | p. 187 |
Pseudo-Dielectric Function | p. 189 |
Optimization of Sample Structures | p. 191 |
Optical Models for Depolarizing Samples | p. 191 |
Data Analysis Procedure | p. 196 |
Linear Regression Analysis | p. 196 |
Fitting Error Function | p. 199 |
Mathematical Inversion | p. 200 |
References | p. 204 |
Ellipsometry of Anisotropic Materials | p. 209 |
Reflection and Transmission of Light by Anisotropic Materials | p. 209 |
Light Propagation in Anisotropic Media | p. 209 |
Index Ellipsoid | p. 213 |
Dielectric Tensor | p. 215 |
Jones Matrix of Anisotropic Samples | p. 217 |
Fresnel Equations for Anisotropic Materials | p. 222 |
Anisotropic Substrate | p. 222 |
Anisotropic Thin Film on Isotropic Substrate | p. 224 |
4 x 4 Matrix Method | p. 226 |
Principles of the 4 x 4 Matrix Method | p. 226 |
Calculation Method of Partial Transfer Matrix | p. 232 |
Calculation Methods of Incident and Exit Matrices | p. 233 |
Calculation Procedure of the 4 x 4 Matrix Method | p. 236 |
Interpretation of ([psi], [Delta]) for Anisotropic Materials | p. 237 |
Variations of ([psi], [Delta]) in Anisotropic Substrates | p. 237 |
Variations of ([psi], [Delta]) in Anisotropic Thin Films | p. 241 |
Measurement and Data Analysis of Anisotropic Materials | p. 243 |
Measurement Methods | p. 243 |
Data Analysis Methods | p. 245 |
References | p. 246 |
Data Analysis Examples | p. 249 |
Insulators | p. 249 |
Analysis Examples | p. 249 |
Advanced Analysis | p. 252 |
Semiconductors | p. 256 |
Optical Transitions in Semiconductors | p. 256 |
Modeling of Dielectric Functions | p. 258 |
Analysis Examples | p. 262 |
Analysis of Dielectric Functions | p. 268 |
Metals/Semiconductors | p. 276 |
Dielectric Function of Metals | p. 276 |
Analysis of Free-Carrier Absorption | p. 281 |
Advanced Analysis | p. 286 |
Organic Materials/Biomaterials | p. 287 |
Analysis of Organic Materials | p. 287 |
Analysis of Biomaterials | p. 292 |
Anisotropic Materials | p. 294 |
Analysis of Anisotropic Insulators | p. 295 |
Analysis of Anisotropic Semiconductors | p. 296 |
Analysis of Anisotropic Organic Materials | p. 299 |
References | p. 303 |
Real-Time Monitoring by Spectroscopic Ellipsometry | p. 311 |
Data Analysis in Real-Time Monitoring | p. 311 |
Procedures for Real-Time Data Analysis | p. 312 |
Linear Regression Analysis (LRA) | p. 313 |
Global Error Minimization (GEM) | p. 317 |
Virtual Substrate Approximation (VSA) | p. 323 |
Observation of Thin-Film Growth by Real-Time Monitoring | p. 328 |
Analysis Examples | p. 328 |
Advanced Analysis | p. 331 |
Process Control by Real-Time Monitoring | p. 333 |
Data Analysis in Process Control | p. 334 |
Process Control by Linear Regression Analysis (LRA) | p. 334 |
Process Control by Virtual Substrate Approximation (VSA) | p. 340 |
References | p. 342 |
Appendices | |
Trigonometric Functions | p. 345 |
Definitions of Optical Constants | p. 347 |
Maxwell's Equations for Conductors | p. 349 |
Jones-Mueller Matrix Conversion | p. 353 |
Kramers-Kronig Relations | p. 357 |
Index | p. 361 |
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