Two-dimensional X-ray Diffraction

Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to researchers in materials science, chemistry, physics, and pharmaceuticals, as well as graduate-level students in these areas.

Bob Baoping He is the Director of R&D and Engineering at Bruker AXS (formerly Siemens AXS). Mr. He holds a PhD in materials science from Virginia Tech and holds twelve U.S. patents.

Preface
Introduction
X-Ray Technology and Its Brief History
Geometry of Crystals
Principles of X-Ray Diffraction
Reciprocal Space and Diffraction
Two-Dimensional X-Ray Diffraction
Geometry Conventions
Introduction
Diffraction Space and Laboratory Coordinates
Detector Space and Detector Geometry
Sample Space and Goniometer Geometry
Transformation from Diffraction Space to Sample Space
Summary of XRD2 Geometry
References
X-Ray Source and Optics
X-Ray Generation and Characteristics
X-Ray Optics
References
X-Ray Detectors
History of X-Ray Detection Technology
Point Detectors in Conventional Diffractometers
Characteristics of Point Detectors
Line Detectors
Characteristics of Area Detectors
Types of Area Detectors
Goniometer and Sample Stages
Goniometer and Sample Position
Goniometer Accuracy
Sample Alignment and Visualization Systems
Environment Stages
References
Data Treatment
Introduction
Nonuniform Response Correction
Spatial Correction
Detector Position Accuracy and Calibration
Frame Integration
Lorentz, Polarization, and Absorption Corrections
Phase Identification
Introduction
Relative Intensity
Geometry and Resolution
Sampling Statistics
Preferred Orientation Effect
References
Texture Analysis
Introduction
Pole Density and Pole Figure
Fundamental Equations
Data Collection Strategy
Texture Data Process
Orientation Distribution Function
Fiber Texture
Other Advantages of XRD2 for Texture
References
Stress Measurement
Introduction
Principle of X-Ray Stress Analysis
Theory of Stress Analysis with XRD2
Process of Stress Measurement with XRD2
Experimental Examples
Calculation of Principal Stresses from the General Stress Tensor
Parameters for Stress Measurement
References
Small-Angle X-Ray Scattering
Introduction
2D SAXS Systems
Application Examples
Some Innovations in 2D SAXS
References
Combinatorial Screening
Introduction
XRD2 Systems for Combinatorial Screening
Combined Screening with XRD2 and Raman
Quantitative Analysis
Percent Crystallinity
Crystal Size
Retained Austenite
References
Innovation and Future Development
Introduction
Scanning Line Detector for XRD2
Three-Dimensional Detector
Pixel Direct Diffraction Analysis
References
Values of Commonly Used Parameters
Symbols
Index
Table of Contents provided by Publisher. All Rights Reserved.

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Two-dimensional X-ray Diffraction

Summary

Author Biography

Table of Contents

Supplemental Materials