X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

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ISBN: 9780750302555 | 0750302550
Cover: Hardcover
Copyright: 3/1/1993

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The first ICXOM congress was held in Cambridge, the brain-child of Dr Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Ellis Cosslett pioneered research in X-ray optics & microanalysis & retained a close interest in all subject applications for this area of research: physics, materials science, chemistry & biology. The 1992 congress was held in his memory & at a special symposium friends & colleagues reviewed the present status of research in x-ray optics & microanalysis. S J Pennycook (Oak Ridge National Laboratory, D B Williams (Lehigh University), J A Venables et al (Arizona State University & Sussex University), & C Jacobsen et al (SUNY, Stony Brook) are among the researchers whose papers are included in this volume.

Preface
The Cosslett Symposium: Chairman's introductory remarks	p. 1
X-ray projection microscopy and transmission electron microscopy	p. 9
Early days in the electron microscope section of the Cavendish Laboratory	p. 17
Ellis Cosslett: a physicist fascinated by biology	p. 27
Microanalysis	p. 33
Scanning electron probe microanalysis	p. 43
In memory of V E Cosslett: from scanning with electrons to scanning with light in the investigation of mineralised tissues	p. 53
The end of an era?	p. 59
Recent advances in electron microprobe analysis	p. 67
A new mass absorption coefficient equation	p. 75
MAC measurements with a Borrmann crystal	p. 79
Determination of iron valence in oxides and sulphides by EPMA	p. 83
Soft X-ray spectra of iron in silicates	p. 87
Nicalon fibres: an EPMA and TEM study	p. 91
New possibilities in X-ray microanalysis of nitrogen and oxygen with the application of special types of multilayers	p. 95
Quantitative and mapping application of chemical-shift spectra with EPMA	p. 99
Electron configuration of the valence and the conduction band of magnetite (Fe[subscript 3]O[subscript 4]) and hematite [actual symbol not reproducible]	p. 101
X-ray absorption spectroscopy using an EPMA	p. 105
Simultaneous X-rays and Raman analysis of microsamples: state-of-the art and preliminary results	p. 109
Database and review of quantitative EPMA procedures	p. 113
Evaluation and description of a new correction procedure for quantitative electron probe microanalysis	p. 123
The variable voltage method for calculating the absorption correction for soft X-rays	p. 127
Measurements and calculations of [actual symbol not reproducible]	p. 131
Measurement of film thickness by EPMA	p. 135
Determination by EPMA and X-ray diffraction of the thickness, stoichiometry and crystallinity of thin films (Cr[subscript x]O[subscript y]) deposited on stainless steels	p. 139
A versatile computer program for improving the precision of quantitative electron probe microanalysis results	p. 145
Weibull distribution as applied to EPMA	p. 149
Characterisation of thin films using Monte Carlo methods	p. 153
The spatial resolution of X-ray microanalysis experimental aspects	p. 157
Quantitative electron probe microanalysis of thin III-V semiconductor layers	p. 161
Nuclear microscopy - A novel technique for materials characterisation	p. 165
The use of high purity germanium detectors for X-ray microanalysis	p. 173
Modern trends in energy dispersive X-ray emission analysis	p. 177
Microanalytical examination of segregation near the reduction front in the Mg, Mn and Ca doped wustites	p. 181
Non-equilibrium states of eutectics in Mg-Zn alloys	p. 185
Composition of M[subscript 6]C carbides formed in nickel-based hardfacing alloys	p. 189
Application of X-ray microanalysis to investigate adhesion of copper thick films	p. 193
Relative changes between the number and calcium content of atrial specific granules	p. 197
SEM and EDX studies of Na penetration in carbon and graphite materials	p. 201
Study of bioactivity on glass-ceramic for artificial bone in vivo and vitro	p. 205
Effect of TiO[subscript 2] addition on crystallization of phlogopite and Apatite-containing glass ceramic	p. 209
Microstructural studies of the production of BSCCO superconductors by the citrate gel route	p. 213
Atomic resolution imaging and analysis with the STEM	p. 217
Homogeneity of unsupported bimetallic Ni-M catalysts	p. 225
Quantification of grain boundary segregation in TiO[subscript 2] by STEM	p. 229
The rate of mass loss in silicate minerals during X-ray analysis	p. 233
Electro and thermomigration of metallic islands in the Si(100) surface	p. 237
An electroanalytical examination of the gas retention in a ramped (U,Pu)O[subscript 2] irradiated fuel	p. 243
Micro-observation and microanalysis of ZrN films prepared by reactively RF sputtering	p. 247
A microanalytical study of the gills of aluminium-exposed catfish	p. 251
SEM/EDX study of the displacement of silver in [actual symbol not reproducible] grains equilibrated with copper	p. 255
Investigation of the space charge distribution and response characteristics of GaAs MSM Shottky barrier photodetectors with SEM-EBIC	p. 259
The quantitative analysis of thin specimens	p. 263
In-situ chemical analysis of dispersoid particles in two Al-Mg-Si alloys using analytical electron microscopy of thin foils	p. 271
Graphical manipulation of EDS data obtained by SEM	p. 275
Study of carbon in a nickel-based superalloy by EELS	p. 279
Precipitate composition and morphology during reheating of low carbon, microalloyed steel for CCR	p. 283
Precipitation and recrystallization in aluminium alloys	p. 287
Stability and microstructure of ferrites containing aluminum	p. 291
New energy filtering TEM - principles and applications	p. 295
The effect of arsenic and grain size on carbide composition in a low alloy steel	p. 299
Study of formation of Al-Fe alloys by mechanical alloying	p. 303
Characterization of SiAlON ceramics by EPMA and TEM	p. 307
Investigations of titanium dioxide particle size changes during thermal treatment by TEM method	p. 311
A TEM-EDX study of sol-gel derived PLZT thin films	p. 315
Structure/property relationships in carbon fibres	p. 319
Diffuse scattering in nickel-chromium alloys	p. 323
Determination of the processing window and structural characteristics of an austempered compacted cast iron	p. 327
Electron microscopy and XRD analysis of austempered and plasma nitrided S. G. Iron	p. 331
Silicide formation in Mo thin films and Si single-crystal interactions	p. 335
Imaging surfaces with scanning tunnelling and scanning force microscopes
The performance and limits of scanning probe microscopes	p. 347
Aspects of 3-D imaging, display and measurement in light and scanning electron microscopy	p. 353
Determining the form of atomic force microscope tips	p. 361
Developments in image processing	p. 365
Image analysis of clay scanning electron micrographs	p. 371
Prospects for a deconvolution of the electron probe size in transmission X-ray microanalysis	p. 375
A STEM study of core-shell structures in an X7R-type dielectric ceramic	p. 379
Never mind the baby, how about the bath water? Insights from the secondary electron background in electron spectroscopy	p. 383
Expressions for [actual symbol not reproducible] and the Auger backscattering factor at normal and oblique incidences	p. 391
The use of integrated circuits for position-sensitive detection	p. 395
The use of the Rutherford cross section for elastic scattering of electrons at low beam energies and high atomic number targets	p. 403
A simple method of testing the cleanliness of ion bombarded surfaces in Auger microanalysis	p. 407
A new ion optical system for SIMS and SNMS	p. 411
Surface studies in UHV-SEM and STEM	p. 415
Auger-profiling of multilayer structures: new approach	p. 423
Electron spectroscopy at high spatial resolution	p. 427
Sputter-induced concentration profiles in binary alloys	p. 435
Weathering of wood measured by XPS and imaging XMA	p. 439
The performance of the photoelectron spectromicroscope at low and high energies	p. 443
Magnetic lens technology in X-ray photoelectron spectroscopy (XPS): facts and fallacies	p. 451
The role of transfer film chemistry in automotive friction couples	p. 455
Auger image cross correlation with secondary image	p. 461
Photoemission microscopy - A novel technique for failure analysis of VLSI silicon integrated circuits	p. 465
Lithography and polymers: An XPS study	p. 469
Laser-plasma XUV sources, advances in performance	p. 471
Pinch plasmas as intense X-ray sources for laboratory applications	p. 479
X-ray microscopy using a laser-plasma source	p. 483
Imaging with the Vulcan X-ray laser	p. 487
Using soft X-rays from laser generated plasmas for the contact imaging of living biological specimens	p. 491
X-ray optics by the use of 2-D bent crystals	p. 495
Compact laboratory X-ray beam line with focusing microoptics	p. 499
Preparation of soft X-ray monochromators by laser pulse vapour deposition (LPVD)	p. 503
Coherent X-ray laser and its applications	p. 507
Advances in X-ray lasers	p. 511
Laser plasma X-ray source with a gas puff target	p. 515
X-ray crystal spectrometer with CCD linear array	p. 519
X-ray micropobes based on Bragg-Fresnel crystal optics for high energy X-rays	p. 523
High resolution zone plates with high efficiencies for the Gottingen X-ray microscopes	p. 527
Investigation of short period multilayers	p. 531
New doubly curved diffractor geometries and their use in microanalysis	p. 535
High resolution zone plates for X-ray microscopy	p. 539
The computer-aided design of the hard X-ray diffraction lenses	p. 543
X-ray holography at the National Synchrotron Light Source	p. 547
X-ray microscopy studies with the Gottingen X-ray microscopes	p. 555
Review on the development of cone-beam X-ray microtomography	p. 559
Progress in digital X-ray projection microscopy	p. 567
Scanning soft X-ray microscopy	p. 571
X-ray diffraction contrast of polycrystalline material, visualized by scanning X-ray analytical microscope	p. 579
Small d-spacing multilayer structures for the photon energy range E ] 0.3 kev	p. 583
Microspectroscopy and spectromicroscopy at the Hamburg focusing mirror scanning microscope	p. 587
Aberration-corrected spherical and toroidal mirror systems for imaging and focusing of soft X-rays	p. 591
The opportunities and challenges of using high brilliance X-ray synchrotron sources	p. 595
Present status of and future prospects for synchrotron-based microtechniques that utilize X-ray fluorescence, absorption spectroscopy, diffraction and tomography	p. 605
X-ray optics for synchrotron radiation induced X-ray micro fluorescence at the European synchrotron radiation facility, Grenoble	p. 613
Scanning X-ray microprobe with Bragg-Fresnel multilayer lens	p. 617
X-ray probe mapping of calcium deposits in articular cartilage	p. 621
Properties and applications of soft X-ray undulators in structural and microstructural studies of the surfaces of materials	p. 627
Combined time resolved SAXS/WAXS/DSC experiments	p. 635
Summary and highlights of XIII ICXOM92 - What next?	p. 639
Author Index	p. 645
Subject Index	p. 649
Table of Contents provided by Blackwell. All Rights Reserved.

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X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

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X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

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