Cmos Gate-stack Scaling: Materials, Interfaces and Reliability Implications
, by Demkov, Alexander A.; Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, WillyNote: Supplemental materials are not guaranteed with Rental or Used book purchases.
- ISBN: 9781107408326 | 1107408326
- Cover: Paperback
- Copyright: 6/5/2014