- ISBN: 9783527406500 | 3527406506
- Cover: Hardcover
- Copyright: 7/21/2006
Claus Michael Schneider studied physics at the RWTH Aachen University receiving his diploma in 1985. He obtained his PhD in 1990 at the Free University of Berlin and his habilitation in 1996 at the Martin-Luther University Halle-Wittenberg. From 1998 to 2003 he headed the Department of thin Film Systems and Nanostructures at the Leibniz Institute of Solid State and Materials research Dresden. Since June 2003 he directs the Institute "Electronic Properties" within the department of Solid State Research(IFF) at the Forschungzentrum Julich, being jointly appointed as full professor at the University Duisburg-Essen. His research interests include solid state physics, thin film systems, surface magnetism and spintronics as well as the physics of nanostructures.
Preface | XI | ||||
List of Contributors | XIII | ||||
1 Introduction | 1 | (6) | |||
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1 | (1) | |||
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2 | (5) | |||
2 Thin Film Systems: Basic Aspects | 7 | (134) | |||
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7 | (21) | |||
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7 | (1) | |||
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8 | (4) | |||
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12 | (14) | |||
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26 | (2) | |||
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28 | (20) | |||
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28 | (2) | |||
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30 | (10) | |||
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40 | (4) | |||
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44 | (1) | |||
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44 | (1) | |||
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45 | (1) | |||
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45 | (2) | |||
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47 | (1) | |||
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48 | (23) | |||
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48 | (1) | |||
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49 | (6) | |||
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55 | (7) | |||
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62 | (2) | |||
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64 | (4) | |||
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68 | (3) | |||
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71 | (32) | |||
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71 | (2) | |||
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73 | (1) | |||
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74 | (8) | |||
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82 | (11) | |||
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93 | (10) | |||
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103 | (19) | |||
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103 | (2) | |||
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105 | (4) | |||
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109 | (10) | |||
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119 | (3) | |||
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122 | (7) | |||
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122 | (1) | |||
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123 | (1) | |||
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124 | (5) | |||
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129 | (1) | |||
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129 | (12) | |||
3 Thin Film Preparation and Characterization Techniques | 141 | (90) | |||
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141 | (19) | |||
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141 | (2) | |||
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143 | (10) | |||
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153 | (3) | |||
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156 | (4) | |||
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160 | (1) | |||
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160 | (19) | |||
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160 | (8) | |||
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168 | (4) | |||
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172 | (5) | |||
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177 | (2) | |||
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179 | (18) | |||
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180 | (10) | |||
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190 | (4) | |||
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194 | (3) | |||
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197 | (17) | |||
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197 | (10) | |||
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207 | (7) | |||
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214 | (11) | |||
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214 | (3) | |||
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217 | (2) | |||
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219 | (6) | |||
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225 | (6) | |||
4 Challenges for Thin Film Systems Characterization and Optimization | 231 | (118) | |||
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231 | (17) | |||
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231 | (3) | |||
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234 | (3) | |||
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237 | (4) | |||
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241 | (7) | |||
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248 | (13) | |||
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248 | (1) | |||
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249 | (6) | |||
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255 | (4) | |||
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259 | (1) | |||
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260 | (1) | |||
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261 | (22) | |||
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261 | (1) | |||
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262 | (1) | |||
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263 | (4) | |||
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267 | (5) | |||
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272 | (11) | |||
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283 | (12) | |||
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284 | (1) | |||
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285 | (8) | |||
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293 | (2) | |||
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295 | (14) | |||
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296 | (5) | |||
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301 | (4) | |||
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305 | (4) | |||
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309 | (14) | |||
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309 | (2) | |||
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311 | (8) | |||
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319 | (3) | |||
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322 | (1) | |||
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323 | (17) | |||
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324 | (8) | |||
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332 | (8) | |||
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340 | (9) | |||
5 Devices | 349 | (50) | |||
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349 | (4) | |||
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349 | (1) | |||
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350 | (1) | |||
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351 | (2) | |||
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353 | (1) | |||
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353 | (9) | |||
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353 | (1) | |||
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354 | (3) | |||
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357 | (3) | |||
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360 | (1) | |||
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361 | (1) | |||
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362 | (11) | |||
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362 | (1) | |||
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362 | (1) | |||
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363 | (1) | |||
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364 | (2) | |||
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366 | (7) | |||
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373 | (10) | |||
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373 | (1) | |||
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374 | (3) | |||
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377 | (1) | |||
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378 | (2) | |||
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380 | (1) | |||
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381 | (2) | |||
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383 | (11) | |||
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383 | (1) | |||
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383 | (1) | |||
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384 | (6) | |||
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390 | (4) | |||
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394 | (1) | |||
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394 | (5) | |||
6 Outlook | 399 | (6) | |||
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399 | (1) | |||
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400 | (1) | |||
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401 | (1) | |||
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402 | (1) | |||
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403 | (2) | |||
Index | 405 |
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